Nanjing University of Posts and Telecommunicatins

Nantong Institute of Nanjing University of Posts and Telecommunications Co.,ltd.

Dapeng Yan

Zhikuang Cai

Yufeng Guo

Zixuan Wang

Binbin Xu

Lu Liu

Xiaoting Liu

Haiyan Sun

Luping Zhang

A universal test chiplet for testing a plurality of chiplets to be tested is provided. The universal test chiplet includes a chiplet test control circuit module, a test data distribution circuit module, a memory test configuration circuit module, and a chiplet test interface circuit module. The chiplet test control circuit module is configured to provide test data and configure test modes for the chiplets to be tested. The test data distribution circuit module is configured to distribute the test data required by each of the chiplets to be tested from a test data bus. The memory test configuration circuit module is configured to provide test circuits for memories of the chiplets to be tested and automatically generate a test vector. The chiplet test interface circuit module is configured to transmit the test data to the chiplets to be tested in any direction through chiplet test interfaces.

Universal test chiplet

Growing community of inventors

Jiangsu, China

Dapeng Yan