Growing community of inventors

Boise, ID, United States of America

Curtis R Olson

Average Co-Inventor Count = 4.00

ph-index = 1

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 4

Curtis R OlsonPaul A Morgan (2 patents)Curtis R OlsonDavid A Daycock (2 patents)Curtis R OlsonShawn D Lyonsmith (2 patents)Curtis R OlsonPaul G Lindquist (1 patent)Curtis R OlsonJohn J Rosato (1 patent)Curtis R OlsonJane Fahrenkrug (1 patent)Curtis R OlsonCurtis R Olson (3 patents)Paul A MorganPaul A Morgan (54 patents)David A DaycockDavid A Daycock (52 patents)Shawn D LyonsmithShawn D Lyonsmith (16 patents)Paul G LindquistPaul G Lindquist (6 patents)John J RosatoJohn J Rosato (3 patents)Jane FahrenkrugJane Fahrenkrug (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Micron Technology Incorporated (2 from 37,905 patents)

2. Scp Global Technologies, Inc. (1 from 16 patents)


3 patents:

1. 8563435 - Method of reducing damage to an electron beam inspected semiconductor substrate, and methods of inspecting a semiconductor substrate

2. 8334209 - Method of reducing electron beam damage on post W-CMP wafers

3. 6878213 - Process and system for rinsing of semiconductor substrates

Please report any incorrect information to support@idiyas.com
idiyas.com
as of
12/3/2025
Loading…