Ultratera Corporation

Other

United Test Center Inc.

Tsai, Shiann-tsong

Tsai Huang, Yen-mei

Tsai, Hsien-chou

Tsai, Hsien-wei

Chung-Che Tsai

Wei-Heng Shan

Hsien-Chou Tsai

Jin-Chuan Bai

Shiann-Tsong Tsai

Huan-Ping Su

Jinchuan Bai

A semiconductor package includes a substrate having thereon a high-frequency chip and a circuit component susceptible to high-frequency signal interference; a ground pad on the and between the high-frequency chip and the circuit component; a metal-post reinforced glue wall on the ground pad; a molding compound surrounding the metal-post reinforced glue wall and surrounding the high-frequency chip and the circuit component; and a conductive layer disposed on the molding compound and in contact with the metal-post reinforced glue wall. The metal-post reinforced glue wall comprises first metal posts and glue attached to the first metal posts. An interface between a base of each of the first metal posts and the ground pad has a root mean square (RMS) roughness that is less than 1.0 micrometer.

Semiconductor package and fabrication method thereof

A semiconductor package includes a substrate having a semiconductor chip disposed on a top surface of the substrate, a ground ring surrounding the semiconductor chip on the top surface of the substrate, a metal-post reinforced glue wall disposed on the ground ring to surround the semiconductor chip, and a molding compound disposed only inside the metal-post reinforced glue wall and covering the semiconductor chip. The metal-post reinforced glue wall comprises a magnetic or magnetizable filler so as to form an active electro-magnetic compatibility (EMC) shielding.

Semiconductor package with in-package compartmental shielding and active electro-magnetic compatibility shielding

A semiconductor package includes a substrate having at least one semiconductor chip on a top surface of the substrate; a ground ring, on the top surface of the substrate, surrounding the at least one semiconductor chip; a metal-post reinforced glue wall disposed on the ground ring, surrounding the at least one semiconductor chip; a molding compound surrounding the at least one semiconductor chip, wherein a rear surface of the at least one semiconductor chip is flush with an upper surface of the molding compound; a conductive layer disposed on the molding compound and in direct contact with the rear surface of the semiconductor chip and the metal-post reinforced glue wall; a solder layer disposed on the conductive layer; and a heat sink disposed on the solder layer.

Semiconductor package with in-package compartmental shielding and improved heat-dissipation performance

A semiconductor package includes a substrate. A high-frequency chip and a circuit component susceptible to high-frequency interference are disposed on a top surface of the substrate. A first ground ring is disposed on the substrate around the high-frequency chip. A first metal-post reinforced glue wall is disposed on the first ground ring to surround the high-frequency chip. A second ground ring is disposed on the top of the substrate around the circuit component. A second metal-post reinforced glue wall is disposed on the second ground ring to surround the circuit component. Mold-flow channels are disposed in the first and second metal-post reinforced glue walls. A molding compound covers at least the high-frequency chip and the circuit component. A conductive layer is disposed on the molding compound and is coupled to the first metal-post reinforced glue wall and/or the second metal-post reinforced glue wall.

Semiconductor package with in-package compartmental shielding and fabrication method thereof

A semiconductor package includes a substrate. At least a high-frequency chip and a circuit component susceptible to high-frequency interference are disposed on a top surface of the substrate. A first ground ring is disposed on the substrate surrounding the high-frequency chip. A first metal-post reinforced glue wall is disposed on the first ground ring surrounding the high-frequency chip. A second ground ring is disposed on the top of the substrate surrounding the circuit component. A second metal-post reinforced glue wall is disposed on the second ground ring surrounding the circuit component. A molding compound covers at least the high-frequency chip and the circuit component. A conductive layer is disposed on the molding compound and is coupled to the first metal-post reinforced glue wall and/or the second metal-post reinforced glue wall.

A fabrication method of a circuit board is proposed, wherein a core layer is formed with a plurality of conductive traces, and photo resist is respectively applied on terminals of the conductive traces. Then, a non-solderable material is applied over the core layer as to cover the conductive traces except for the insulating material, and the non-solderable material is adapted to be surface-flush with the insulating material, allowing the insulating material to be exposed from the non-solderable material. Finally, the insulating material is removed from the core layer to expose the terminals of the conductive traces, wherein the exposed terminals are used as bond pads or bond fingers where solder balls, solder bumps or bonding wires can be bonded. This circuit board is cost-effectively fabricated by simplified processes, and beneficial in precisely exposing bond pads or bond fingers, thereby significantly improving yield of fabricated circuit boards.

Fabrication method of circuit board

A printed circuit board, which comprises a substrate, a conductive pattern disposed on a surface of said substrate and a solder mask coated on the surface of said substrate and covered over the conductive pattern. The conductive pattern has a bonding pad. The solder mask has an opening corresponding in location to the bonding pad such that a portion of the bonding pad is exposed outside. A space is left between said solder mask and said bonding pad and is communicated with the opening. Whereby, a solder ball can be received in the opening and the space and electrically connected to the bonding pad, such that the solder ball is held on the printed circuit board securely.

Bonding pads of printed circuit board capable of holding solder balls securely

A mold structure for package fabrication is proposed, and includes a top mold, a fixture and a bottom mold. The top mold is formed with at least an upwardly recessed portion; the fixture is formed with a plurality of downwardly recessed portions; and the bottom mold has a recessed cavity for receiving the fixture therein, and adapted to be engaged with the top mold, wherein a resilient member is disposed on an inner wall of the recessed cavity, and interposed between the fixture and the recessed cavity of the bottom mold, allowing the resilient member to provide a resilient force for properly positioning the fixture. By using the above mold structure, chips mounted on a substrate can be firmly supported in the mold structure without causing chip cracks during a molding process for encapsulating the chips.

Mold structure for package fabrication

The present invention is to provide a double-sided thermally enhanced IC chip package which includes a chip being received in an opening of a substrate and electrically connected to a conductive circuit pattern on a top surface of the substrate through bonding wires. A thermally and electrically conductive planar member is attached to an inactive side of the chip through a thermally and electrically conductive adhesive layer. A portion of an active side of the chip to which the bonding wires are connected is encapsulated by a dielectric encapsulant, and the other portion of the active side of the chip is covered by a thermally and electrically conductive encapsulant. Thus, heat generated by the chip can be efficiently dissipated through the planar member and the thermally and electrically conductive encapsulant. The present invention also discloses a stacked chip package with double-sided heat dissipation capability.

Double-sided thermally enhanced IC chip package

A light sensitive semiconductor package and a fabrication method thereof are provided in which a chip is mounted on a chip carrier and encompassed by a dam, and an infrared filter is attached to the dam to hermetically isolate the chip from the atmosphere. An encapsulant is formed on the chip carrier and surrounds the dam, and a lens is supported by the encapsulant to be positioned above the infrared filter. This allows light to penetrate through the infrared filter and lens to reach the chip. Before forming the encapsulant and mounting the lens, the semi-fabricated package with the chip being hermetically isolated by the infrared filter and dam is subject to a leak test, allowing a semi-fabricated package successfully passing the test to be formed with the encapsulant and lens, so as to reduce fabrication costs and improve yield of fabricated package products.

Light sensitive semiconductor package and fabrication method thereof

A fabrication method for a circuit board is proposed, wherein a core layer is formed with a plurality of conductive traces, and photo resist is applied on terminals of the conductive traces. A non-solderable material is peelably applied over a support member, and attached to the core layer to cover the conductive traces, wherein adhesion between the support member and the non-solderable material is smaller than adhesion between the non-solderable material and the core layer. Then, the support member is peeled to expose the non-solderable material; further, the non-solderable material is partly removed to expose the photo resist. Finally, the photo resist is etched away to expose the terminals of the conductive traces. The exposed terminals serve as bond pads or fingers where solder balls, bumps or wires are bonded for electrical connection purpose.

Fabrication method for circuit board

A stacked multi-chip semiconductor package and a fabrication method thereof are provided. A chip carrier is formed with an opening for receiving a first chip therein, and a second chip is stacked on the first chip and over the opening, wherein the first and second chips are respectively electrically connected to the chip carrier by bonding wires. A first encapsulant is formed to encapsulate first chip and corresponding bonding wires, and a second encapsulant is formed around the second chip to encompass a cavity for receiving the second chip and corresponding bonding wires therein. A lid is attached to the second encapsulant for covering the cavity. This semiconductor package allows high integration and increase in operational performances by virtue of stacked multi-chip structure.

Low profile stacked multi-chip semiconductor package with chip carrier having opening and fabrication method of the semiconductor package

A stacked chip package has a substrate with a through hole. A first chip is received in the through hole. A second chip is disposed on the first chip. Two chips are electrically connected to an upper surface of the substrate. An adhesive layer and a planar member, which are thermally and electrically conductive, are disposed on a lower surface of the substrate to support the chips and dissipate the heat generated by the chips. An encapsulant covers the upper surface of the substrate. The package has superior heat-dissipating ability, high yield in assembly and small size.

Stacked chip package with enhanced thermal conductivity

A semiconductor package and a fabrication method thereof are provided. A plurality of first chips are mounted on and electrically connected to a substrate plate. A shielding structure including a shielding portion and a supporting portion is mounted on the substrate plate, wherein the supporting portion abuts against the substrate plate, and the shielding portion is formed with a plurality of openings corresponding in position to the first chips. An adhesive is applied through the openings to form adhesive layers respectively on the first chips. After removing the shielding structure from the substrate plate, a plurality of second chips are respectively stacked on the adhesive layers and electrically connected to the substrate plate. By performing molding and singulating processes, the packaged structure is singulated to form individual semiconductor packages. It is a characteristic advantage of forming the adhesive layers in a batch manner, making fabrication costs and time significantly reduced.

Semiconductor package and method for fabricating the same

A low profile stack semiconductor package is proposed. A lower chip having centrally-situated bond pads is mounted on a substrate, and electrically connected to the substrate by bonding wires. A cushion member is peripherally situated on the lower chip, allowing the bonding wires to extend from the bond pads in a direction parallel to the lower chip, and to reach the cushion member beyond which the bonding wires turn downwardly to be directed toward the substrate. An adhesive is applied on the lower chip, for encapsulating the bond pads, cushion member and bonding wires. This allows an upper chip to be readily stacked on the lower chip by attaching the upper chip to the adhesive, without affecting or damaging structural or electrical arrangement formed on the lower chip.

Growing community of inventors

Taipei, Taiwan

Chung-Che Tsai