Growing community of inventors

Pittsford, NY, United States of America

Christopher Alan Lee

Average Co-Inventor Count = 3.13

ph-index = 2

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 12

Christopher Alan LeeMark Joseph Tronolone (6 patents)Christopher Alan LeeThomas James Dunn (6 patents)Christopher Alan LeeJohn Weston Frankovich (3 patents)Christopher Alan LeeAndrew W Kulawiec (2 patents)Christopher Alan LeeRobert Dennis Grejda (2 patents)Christopher Alan LeeMatthew Ronald Millecchia (2 patents)Christopher Alan LeePaul Gerard Dewa (1 patent)Christopher Alan LeeYoshihiro Nakamura (1 patent)Christopher Alan LeeJack Weston Frankovich (1 patent)Christopher Alan LeeDavid L Aronstein (1 patent)Christopher Alan LeeMichael Joseph Litzenberger (1 patent)Christopher Alan LeeAlexander Timothy Bean (1 patent)Christopher Alan LeeKatherine Nicole Ballman (1 patent)Christopher Alan LeeChristopher Alan Lee (12 patents)Mark Joseph TronoloneMark Joseph Tronolone (14 patents)Thomas James DunnThomas James Dunn (13 patents)John Weston FrankovichJohn Weston Frankovich (6 patents)Andrew W KulawiecAndrew W Kulawiec (14 patents)Robert Dennis GrejdaRobert Dennis Grejda (12 patents)Matthew Ronald MillecchiaMatthew Ronald Millecchia (2 patents)Paul Gerard DewaPaul Gerard Dewa (19 patents)Yoshihiro NakamuraYoshihiro Nakamura (10 patents)Jack Weston FrankovichJack Weston Frankovich (6 patents)David L AronsteinDavid L Aronstein (2 patents)Michael Joseph LitzenbergerMichael Joseph Litzenberger (1 patent)Alexander Timothy BeanAlexander Timothy Bean (1 patent)Katherine Nicole BallmanKatherine Nicole Ballman (1 patent)
..
Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. Corning Incorporated (12 from 7,273 patents)


12 patents:

1. 11555791 - Chamber for vibrational and environmental isolation of thin wafers

2. 11551347 - Devices, systems, and methods of generating and providing a target topographic map for finishing a photomask blank subject to functional requirements on flatness

3. 10871369 - Systems for and methods of measuring photomask flatness with reduced gravity-induced error

4. 9829310 - Interferometric roll-off measurement using a static fringe pattern

5. 9513214 - Skewed sectional measurement of striated glass

6. 8531677 - Frequency-shifting interferometer with selective data processing

7. 8379219 - Compound interferometer with monolithic measurement cavity

8. 8218586 - Littman configured frequency stepped laser

9. 7986414 - Measurement of multiple surface test objects with frequency scanning interferometer

10. 7916763 - Current driven frequency-stepped radiation source and methods thereof

11. 7286238 - Feature isolation for frequency-shifting interferometry

12. 6757067 - Fringe pattern discriminator for grazing incidence interferometer

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12/27/2025
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