Globalfoundries Singapore Pte. Ltd.

National University of Singapore

Chartered Semiconductor Manufacturing Ltd (corporation)

Cho Jui Tay

Gek Soon Chua

Qunying Lin

Chenggen Quan

Sia Kim Tan

Soo Jin Chua

Siew Lok Toh

Moh Lung Ling

Mustafizur Rahman

Ramam Akkipeddi

Christopher P Sperring

Christopher Philip Sperring

A method for fabricating a semiconductor device that includes: providing a substrate prepared with a photoresist layer; providing a photomask comprising a first and a second pattern having a respective first and second pitch range; providing a composite aperture comprising a first and a second off-axis illumination aperture pattern, the first off-axis aperture pattern having a configuration that improves the process window of the first pitch range and the second off-axis aperture pattern having a configuration that improves the process window for a second pitch range; exposing the photoresist layer on the substrate with radiation from an exposure source through the composite aperture and the photomask; and developing the photoresist layer to pattern the photoresist layer.

Methods for enhancing photolithography patterning

A method for forming a semiconductor device is presented. The method includes providing a substrate having a photoresist thereon and transmitting a light source through a mask having a pattern onto the photoresist. The mask comprises a mask substrate having first, second and third regions, the third region is disposed between the first and second regions. The mask also includes a light reducing layer over the mask substrate having a first opening over the first region and a second opening over the second region. The first and second openings have layer sidewalls. The sidewalls of the light reducing layer are slanted at an angle less than 90 degrees from the plane of a top surface of the mask substrate. The method also includes developing the photoresist to transfer the pattern of the mask to the photoresist.

Angled-wedge chrome-face wall for intensity balance of alternating phase shift mask

A method for forming a phase shift mask is presented. The method includes providing a substrate including a transparent material having first, second and third regions, the third region being disposed between the first and second regions. The method also includes forming a light reducing layer on a first major surface of the substrate. The light reducing layer is patterned to form a patterned light reducing layer having sidewalls defining openings to expose the first and second regions. The patterned light reducing layer is processed to transform the sidewalls of the patterned light reducing layer to angled sidewalls having an angle of less than 90&#xb0; from a plane of the first major surface of the substrate. The angled sidewalls improve intensity balance of an image-formed by light-transmitted through the mask.

A contact pressure sensor () and method for manufacturing a contact pressure sensor for detecting contact pressure between two surfaces is disclosed. The contact pressure sensor disclosed comprises a substrate () for supporting the sensor and a contact pressure sensitive layer () sensitive to pressure applied to the contact pressure sensor. The method disclosed also comprises transferring a process post structure () that is formed on a first process support substrate () from the first process support substrate to a second contact pressure sensor support substrate (

Contact pressure sensor and method for manufacturing the same

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Singapore, Singapore

Cho Jui Tay