National Yang Ming Chiao Tung University

Faraday Technology Corporation

Ching-Te Chuang

Ming-Hsien Tu

Shyh-Jye Jou

Wei Hwang

Hao-I Yang

Wei-Chiang Shih

Chien-Yu Lu

Chia-Cheng Chen

Nan-Chun Lien

Yi-Wei Lin

Yi-Wei Chiu

Pin Chia Su

Ming-Chien Tsai

Ming-Long Fan

Pi-Ho Hu

Mao-Chih Hsia

Jihi-Yu Lin

Wei-Nan Liao

Chi-Shin Chang

Kuen-Di Lee

Chien-Yu Hsieh

Li-Wei Chu

Geng-Cing Lin

Po-Tsang Huang

Shu-Lin Lai

Kun-Ti Lee

Chao-Kuei Chung

Yin-Nien Chen

Hung-Yu Li

Shao-Cheng Wang

Jhih-Yu Lin

Jyun-Kai Chu

Hung-Yu Lee

Chih-Hao Chang

Kun-Di Lee

Yung-Wei Lin

Shyh-Chyi Yang

Chi-Hsin Chang

Yu-Hao Hu

Ming-Ching Zheng

Chien-Hen Chen

A circuit for mitigating write disturbance including a first and a second discharge control paths is provided and applied to the dual-port SRAM. The first discharge control path is connected to bit lines of the second port and the first port, and a first control line. The second discharge control path is connected to inverse bit lines of the second port and the first port, and the first control line. A first discharge current is generated when the bit line of the second and the first ports are respectively at a high level voltage, and a low level voltage, and the first control line operates. A second discharge current is generated when the inverse bit line of the second and the first ports are respectively at the high level voltage and the low level voltage, and the first control line operates.

Circuit for mitigating write disturbance of dual-port SRAM

A static memory cell is provided. The static memory cell includes a data latch circuit and a voltage provider. The data latch circuit is configured to store a bit data. The data latch circuit has a first inverter and a second inverter, and the first inverter and the second inverter are coupled to each other. The first inverter and the second inverter respectively receive a first voltage and a second voltage as power voltages. The voltage provider provides the first voltage and the second voltage to the data latch circuit. When the bit data is written to the data latch circuit, the voltage provider adjusts a voltage value of one of the first and second voltages according to the bit data.

Static memory cell

A control circuit of SRAM and an operating method thereof are provided. The control circuit includes a memory array, a word-line driver, a boost circuit and a voltage level detecting circuit. The memory array includes a plurality of memory cells. Each memory cell includes a plurality of transistors. The word-line driver is to activate the word-line of the memory array for cell storage data access. The boost circuit is to provide the higher voltage source for the word-line driver and a first operating voltage for boosting the first operating voltage to a second operating voltage. The voltage level detecting circuit is detecting if the first operation voltage needs to be boosted with boost-operation and a detecting-trigger signal and controls the operating of the boost circuit based on the detecting-trigger signal, the first operating voltage and a predetermined voltage.

Control circuit of SRAM and operating method thereof

A static random access memory apparatus and a bit-line voltage controller includes a controller, a pull-up circuit, a pull-down circuit and a voltage keeping circuit. The controller receives a bank selecting signal and a clock signal, and decides a pull-up time period, a pull-down time period and a voltage keeping time period according to the bank selecting signal and the clock signal. The pull-up circuit pulls up a bit-line power according to a first reference voltage within the pull-up time period. The pull-down circuit pulls down the bit-line power according to a second reference voltage within the pull-down time period. The voltage keeping circuit keeps the bit-line power to equal to an output voltage during the voltage keeping time period. The voltage keeping time period is after the pull-up time period and the pull-down time period.

Static random access memory apparatus and bit-line voltage controller thereof

A static memory and a static memory cell are provided. The static memory cell includes a first transistor, a second transistor, a third transistor, a fourth transistor, a fifth transistor, a sixth transistor, a first switch, a second switch, a third switch, a first pull-down switch, and a second pull-down switch. When a data writing operation is performed, the latching capability of the latch circuit constituted by the first to the sixth transistors is disabled by turning off the second transistor or the fifth transistor, so that the speed of the data writing operation is increased and the data writing performance is improved. The first switch and the second switch provide a path for reading or writing data, and the third switch is coupled to a bit line for receiving data from or transmitting data to the bit line.

Static memory and memory cell thereof

The present invention provides an oscillator which is based on a 6T SRAM for measuring the Bias Temperature Instability. The oscillator includes a first control unit, a first inverter, a second control unit, and a second inverter. The first control unit is coupled with the first inverter. The second control unit is coupled with the second inverter. The first control unit and the second control unit is used to control the first inverter and the second inverter being selected, biased, and connected respectively, so that the NBTI and the PBTI of the SRAM can be measured separately, and the real time stability of the SRAM can be monitored immediately.

Oscillato based on a 6T SRAM for measuring the bias temperature instability

A static random access memory includes a pre-charger, a first cell column array/peripheral circuit, and a first ripple buffer. The pre-charger is connected to a first local bit line in order to pre-charge the first local bit line. The first cell column array/peripheral circuit is connected to the first local bit line and has a plurality of cells for temporarily storing data. The cells are connected to the first local bit line. The first ripple buffer is connected to the first local bit line and a second local bit line in order to send the data from the first local bit line to the second local bit line.

Static random access memory with ripple bit lines/search lines for improving current leakage/variation tolerance and density/performance

The present invention provides an IG 7T FinFET SRAM, which adopts independently-controlled-gate super-high-VFinFETs to achieve a stacking-like property, whereby to eliminate the read disturb and half-select disturb. Further, the present invention uses keeper circuits and read control voltage to reduce leakage current of the bit lines during read. Furthermore, the present invention can effectively overcome the problem of the conventional 6T SRAM that is likely to have read errors at low operation voltage.

Independently-controlled-gate SRAM

A single-ended SRAM including at least one memory cell and a third switch is provided. The memory cell includes a data-latching unit, a first switch, a second switch and a data-transferring unit. The data-latching unit is configured for latching the received input data and provides a storage data and the inverse data of the storage data. The first switch transfers a reference data to the data-latching unit according to a first word-line signal. The second switch transfers the reference data to the data-latching unit according to a second word-line signal. The data-transferring unit decides whether or not to transfer the reference data to the bit-line according to the storage data and a control signal. The third switch receives the reference data and the control signal and transfers the reference data to the first switch, the second switch and the data-transferring unit according to the control signal.

Single-ended SRAM with cross-point data-aware write operation

A SRAM that keeps the memory cell array under a low voltage in the Standby mode and Write mode, and raises the memory cell array supply voltage to a high voltage in the Read mode. A SRAM comprising: at least one memory cell circuit, comprising a latch circuit with at least two inverters, and comprising two power receiving terminals for receiving power; and a power supplying circuit, for providing the power to the memory cell circuit, such that the voltages at the power receiving terminals of the latch circuit is below a predetermined voltage level when data is written to the latch circuit. In one embodiment, the memory cell circuit includes a plurality of data accessing terminals and the data accessing terminals are respectively controlled by at least two pass-transistor switch devices.

Low power static random access memory

A threshold voltage measurement device is disclosed. The device is coupled to a 6T SRAM. The SRAM comprises two inverters each coupled to a FET. Power terminals of one inverter are in a floating state; the drain and source of the FET coupled to the inverter are short-circuited. Two voltage selectors, a resistor, an amplifier and the SRAM are connected in a negative feedback way. Different bias voltages are applied to the SRAM for measuring threshold voltages of two FETs of the other inverter and the FET coupled to the other inverter. The present invention uses a single circuit to measure the threshold voltages of the three FETs without changing the physical structure of the SRAM. Thereby is accelerated the measurement and decreased the cost of the fabrication process and measurement instruments.

Threshold voltage measurement device

The present invention proposes a gate oxide breakdown-withstanding power switch structure, which is connected with an SRAM and comprises a first CMOS switch and a second CMOS switch respectively having different gate-oxide thicknesses or different threshold voltages. The CMOS switch, which has a normal gate-oxide thickness or a normal threshold voltage, provides current for the SRAM to wake up the SRAM from a standby or sleep mode to an active mode. The CMOS switch, which has a thicker gate-oxide thickness or a higher threshold voltage, provides current for the SRAM to work in an active mode. The present invention prevents a power switch from gate-oxide breakdown lest noise margin, stabilization and performance of SRAM be affected.

Gate oxide breakdown-withstanding power switch structure

A Random Access Memory (RAM) with a plurality of cells is provided. In an embodiment, the cells of a same column are coupled to a same pair of bit-lines and are associated to a same power controller. Each cell has two inverters; the power controller has two power-switches. For the cells of the same column, the two power-switches respectively perform independent supply voltage controls for the two inverters in each cell according to data-in voltages of the bit-lines during Write operation.

Data-aware dynamic supply random access memory

SRAM writing system and related apparatus are provided. The writing system of the invention has a dummy replica writing circuit, a negative pulse controller and at least a normal writing circuit; each normal writing circuit includes a write driver and a negative pulse supplier. While writing, the dummy replica writing circuit drives a dummy replica bit-line, such that the negative pulse controller generates a negative pulse control signal according to level of the dummy replica bit-line. In each writing circuit, when the write driver conducts to connect an associated bit-line to a bias end for driving a level transition, the negative pulse supplier switches the bias end from an operation voltage to a different negative pulse voltage according to the received negative pulse control signal.

SRAM writing system and related apparatus

A static random access memory with data controlled power supply, which comprises a memory cell circuit and at least one Write-assist circuit, for providing power to the memory cell circuit according to data to be written to the memory cell circuit.

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Taipei, Taiwan

Ching-Te Chuang