Apple Inc.

Chih-Ming Chung

Jun Zhai

Yizhang Yang

Jie-Hua Zhao

Yifan Kao

Taegui Kim

Young Doo Jeon

Jun Chung Hsu

Semiconductor packaging substrates and processing sequences are described. In an embodiment, a packaging substrate includes a build-up structure, and a patterned metal contact layer partially embedded within the build-up structure and protruding from the build-up structure. The patterned metal contact layer may include an array of surface mount (SMT) metal bumps in a chip mount area, a metal dam structure or combination thereof.

Semiconductor packaging substrate fine pitch metal bump and reinforcement structures

Package on package structures and manners of formation are described. In an embodiment, an array of trenches is formed partially through a fan-out substrate. In an embodiment, a plurality of laterally separate locations thermal interface material is dispensed onto an array of embedded bottom die. In an embodiment a thermal compression tool including an array of cavities corresponding to an array of top packages is brought into contact with the array of top packages and underlying fan-out substrate during PoP joint formation. The fan-out substrate may be secured to a vacuum chuck during several processing operations.

Fan-out pop stacking process

In some embodiments, a semiconductor device package may include a semiconductor device package on package assembly. The package on package assembly may include a first package, a second package, and a shield. The first package may include a first surface, a second surface substantially opposite the first surface, a first die, and a first set of electrical conductors coupled to the first surface and configured to electrically connect the package on package assembly. The second package may include a third surface and a fourth surface substantially opposite the third surface, and a second die. The third surface may be coupled to the second surface. The first package may be electrically coupled to the second package. The shield may be applied to the fourth surface of the semiconductor device package assembly. In some embodiments, the shield may transfer, during use, heat from the first die.

Thermally enhanced package-on-package structure

Packages and methods of formation are described. In an embodiment, a system in package (SiP) includes first and second redistribution layers (RDLs), stacked die between the first and second RDLs, and conductive pillars extending between the RDLs. A molding compound may encapsulate the stacked die and conductive pillars between the first and second RDLs.

Fan out system in package and method for forming the same

Fan-out PoP stacking process

A PoP (package-on-package) package includes a bottom package coupled to a top package. Terminals on the top of the bottom package are coupled to terminals on the bottom of the top package with an electrically insulating material located between the upper surface of the bottom package and the lower surface of the top package. The bottom package and the top package are coupled during a process that applies force to bring the packages together while heating the packages.

PoP structure with electrically insulating material between packages

A PoP (package-on-package) package includes a bottom package with a substrate encapsulated in an encapsulant with a die coupled to the top of the substrate. At least a portion of the die is exposed above the encapsulant on the bottom package substrate. A top package includes a substrate with encapsulant on both the frontside and the backside of the substrate. The backside of the top package substrate is coupled to the topside of the bottom package substrate with at least part of the die being located in a recess in the encapsulant on the backside of the top package substrate.

Growing community of inventors

Cupertino, CA, United States of America

Chih-Ming Chung