Taiwan Semiconductor Manufacturing Comp. Ltd.

Chia-Ao Chang

De-Wei Yu

Chien-Hao Chen

Pin-Ju Liang

Yee-Chia Yeo

Chii-Horng Li

Pei-Ren Jeng

Yung-Cheng Lu

Hsueh-Chang Sung

Lun-Kuang Tan

Cheng-Po Chau

Meng-Ku Chen

Ping Hung Li

Hui-Ying Lu

A method includes depositing a silicon layer, which includes first portions over a plurality of strips, and second portions filled into trenches between the plurality of strips. The plurality of strips protrudes higher than a base structure. The method further includes performing an anneal to allow parts of the first portions of the silicon layer to migrate toward lower parts of the plurality of trenches, and performing an etching on the silicon layer to remove some portions of the silicon layer.

Method of performing gap filling including filling trenches between dummy gate stacks on semiconductor fins/strips with semiconductor material

A system and methods of manufacturing semiconductor devices is described herein. The method includes forming a recess between fins in a substrate and forming a dielectric layer over the fins and in the recess. Once the dielectric layer has been formed, a bottom seed structure is formed over the dielectric layer within the recess and the dielectric layer is exposed along sidewalls of the recess. A dummy gate material is grown from the bottom seed structure in a bottom-up deposition process without growing the dummy gate material from the dielectric layer exposed along sidewalls of the recess.

System and methods of manufacturing semiconductor devices

A method of forming a semiconductor device includes depositing a film over a dielectric layer. The dielectric layer is over a first fin, a second fin, and within a trench between the first fin and the second fin. The method further includes etching top portions of the film, performing a treatment on the dielectric layer to remove impurities after etching the top portions of the film, and filling the trench over the remaining portions of the film. The treatment includes bombarding the dielectric layer with radicals.

Semiconductor device and method for manufacture

Method of gap filling using conformal deposition-annealing-etching cycle for reducing seam void and bending

An improved dummy gate and a method of forming the same are disclosed. In an embodiment, the method includes depositing a first material in a trench, the trench being disposed between a first fin and a second fin; etching the first material to expose an upper portion of sidewalls of the trench; and depositing a second material on the first material without the second material being deposited on the exposed upper portion of the sidewalls of the trench.

Semiconductor device and method

Embodiments disclosed herein relate generally to forming a structure, e.g., in high aspect ratio trenches. In an embodiment, a method for semiconductor processing is provided. The method includes forming fins on a substrate. Sidewalls of the fins and a bottom surface between the sidewalls of the fins define a trench therebetween. The method includes forming a gate structure over the fins. The gate structure has a sidewall with a defect region formed therein. The method includes forming a filling layer to fill the defect region in the sidewall of the gate structure.

Defect filling in patterned layer

A method may include depositing a first conductive material in an opening disposed between a first semiconductor structure and a second semiconductor structure, the first conductive material comprising at least one first void. The method further includes removing a portion of the first conductive material to form a trench, the trench exposing the at least one first void and being defined by a remaining portion of the first conductive material; and depositing a second conductive material in the trench, the second conductive material and the remaining portion of the first conductive material forming a dummy gate layer.

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Jinhu, China

Chia-Ao Chang