Samsung Electronics Co., Ltd.

Chang-hyun Bae

Jun-Bae Kim

Daehyun Kwon

Jin Kwan Park

Jang Hoo Kim

Hye-seung Yu

Yoo-chang Sung

A memory module includes a plurality of memory devices. Each of the plurality of memory devices includes a plurality of data input/output pads, a plurality of on-die termination (ODT) circuits each including one or more resistors, a plurality of transceiver circuits each including one or more transmission drivers and one or more reception buffers, and a plurality of equalizer circuits each including one or more inductors. Each of the plurality of equalizer circuits is connected to one of the plurality of data input/output pads, one of the plurality of ODT circuits, and one of the plurality of transceiver circuits. Each of the one or more transmission drivers drives a node of one of the plurality of data input/output pads. Inductances of the one or more inductors have individual values which are based on a driver strength of each of the one or more transmission drivers.

Memory module and electronic system including the same

A semiconductor memory device includes a delay lock loop (DLL) performing a locking operation at a wide frequency range and reducing current consumption. The semiconductor memory device includes a (DLL) having serially connected delay cells that receive and delay an external clock signal, wherein a predetermined number of delay cells of the serially connected delay cells that are to perform a delay operation are turned on in response to a threshold frequency recognition signal and first and second delay cell on signals, and for generating an internal clock signal; and a controller for generating the threshold frequency recognition signal and the first and second delay cell on signals, which reduce current consumption of each of the serially connected delay cells and increase a period of delay time thereof, if more delay cells are to be turned on when a delay cell indicating a threshold frequency is turned on.

Semiconductor memory device having delay lock loop with wide frequency range and delay cell current reduction scheme

Growing community of inventors

Hwaseong-si, South Korea

Chang-hyun Bae