Dell Products Inc.

Chandra V Krishnaswamy

William Andrew Smith

Roshan Pai

A method may include transmitting first test signals to electrical pathways of a connector-cable interface between a cable and a test circuit board in the absence of and in the presence of mechanical stress applied by a mechanical stressor to the connector-cable interface, performing vector network analysis measurements for one or more electrical parameters based on resultant signals from the electrical pathways resulting from the test signals in the absence of and in the presence of mechanical stress applied by the mechanical stressor to the connector-cable interface, transmitting one or more second test signals to electrical pathways of the connector-cable interface in the presence of mechanical stress applied by the mechanical stressor to the connector-cable interface, and based on differences between the vector network analysis measurements, determining whether or not the connector-cable interface has satisfied signal integrity requirements.

Systems and methods for testing cabled interconnects under mechanical stress

A method may include transmitting one or more first test signals to electrical pathways of a connector-cable interface between a cable and a test circuit board in the absence of mechanical stress applied by a mechanical stressor to the connector-cable interface, performing measurements for one or more signal equalization parameters based on resultant signals from the electrical pathways resulting from the one or more first test signals in the absence of and in the presence of mechanical stress applied by the mechanical stressor to the connector-cable interface, and based on differences between the measurements, determining whether or not the connector-cable interface has satisfied signal integrity requirements.

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Cedar Park, TX, United States of America

Chandra V Krishnaswamy