Safran Electronics & Defense

Cédric Autie

Thibault Porteboeuf

A production method for producing a circuit optimized to be protected against radiation includes a preliminary characterization stage performed on a reference circuit. The preliminary characterization stage includes the steps of: irradiating the reference circuit a plurality of times; after each irradiation, if one or more reference elements of the reference circuit have failed, locating said reference element(s); and mapping the impact of the irradiations on the reference surface of the reference circuit. The production method further includes an optimization stage comprising the step of adapting the position of at least one optimized radiation-sensitive element on at least one optimized surface of the optimized circuit as a function of the mapping performed on the reference circuit.

Method for producing a circuit which is optimized for protection against radiation

A protection method for protecting an FPGA against natural radiation, the method comprising the steps of: defining at least one category of constraining signals defined so that a predetermined placement and routing tool cannot route more than a determined maximum number of different constraining signals to any one zone of the surface of the FPGA; replicating an initial logic module in order to obtain a plurality of replicated logic modules forming a replicated logic cell; and associating constraining signals with the replicated logic modules in such a manner that the number of constraining signals associated with the replicated logic cell is greater than a determined maximum number in order to force the placement and routing tool to place the replicated logic modules of the replicated logic cell in distinct zones of the surface of the FPGA.

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Paris, France

Cédric Autie