Tokyo Electron Limited

Bruce David Gittleman

Jozef Brcka

Frank M Cerio, Jr

Rodney Lee Robison

Glyn J Reynolds

Michael James Grapperhaus

John Stephen Drewery

Jacques Faguet

Mirko Vukovic

Tugrul Yasar

Derrek Andrew Russell

Frank Cerio

Thomas J Licata

Doug Caldwell

Jason Smolanoff

Jim Zibrida

Vu Bui

An iPVD system is programmed to deposit uniform material, such as barrier material, into high aspect ratio nano-size features on semiconductor substrates using a process which enhances the sidewall coverage compared to the field and bottom coverage(s) while minimizing or eliminating overhang within a vacuum chamber. The iPVD system is operated at low target power and high pressure &#x3e;50 mT to sputter material from the target. RF energy is coupled into the chamber to form a high density plasma. A small RF bias (less than a few volts) can be applied to aid in enhancing the coverage, especially at the bottom.

Ionized physical vapor deposition (iPVD) process

An iPVD apparatus () is programmed to deposit material () onto semiconductor substrates () by cycling between deposition and etch modes within a vacuum chamber (). Static magnetic fields are kept to a minimum during at least the etch modes, at least less than 150 Gauss, typically less than 50 Gauss, and preferably in the range of 0-10 Gauss. Static magnetic fields during deposition modes may be more than 150 Gauss, in the range of 0-50 Gauss, or preferably 20-30 Gauss, and may be the same as during etch modes or switched between a higher level during deposition modes and a lower level, including zero, during etch modes. Such switching may be by switching electromagnet current or by moving permanent magnets, by translation or rotation. Static magnetic fields are kept to a minimum during at least the etch modes, at least less than 150 Gauss, typically less than 50 Gauss, and preferably in the range of 1-10 Gauss. The modes may operate at different power and pressure parameters. Pressure of more than 50 mTorr are preferred for deposition in a thermalized plasma while pressure of less than a few mTorr is preferred for etching.

Ionized PVD with sequential deposition and etching

An iPVD apparatus ( ) is programmed to deposit material ( ) into high aspect ratio submicron features ( ) on semiconductor substrates ( ) by cycling between deposition and etch modes within a vacuum chamber ( ). The modes operate at different power and pressure parameters. Pressure of more than 50 mTorr, for example, is used for sputtering material from a target while pressure of less than a few mTorr, for example, is used to etch. Bias power on the substrate is an order of magnitude higher for etching, producing several hundred volt bias for etching, but only a few tens of volts for deposition. The alternating etching modes remove deposited material that overhangs edges of features on the substrate, removes some of the deposited material from the bottoms ( ) of the features, and resputters the removed deposited material onto sidewalls ( ) of the features. The substrate ( ) is cooled during deposition and etching, and particularly during etching to substantially below 0&deg; C. RF energy is coupled into the chamber ( ) to form a high density plasma, with substantially higher RF power coupled during deposition than during etching. The substrate ( ) is moved closer to the plasma source during etching than during deposition.

Ionized Physical Vapor Deposition (IPVD) is provided by a method of apparatus ( ) particularly useful for sputtering conductive metal coating material from an annular magnetron sputtering target ( ). The sputtered material is ionized in a processing space between the target ( ) and a substrate ( ) by generating a dense plasma in the space with energy coupled from a coil ( ) located outside of the vacuum chamber ( ) behind a dielectric window ( ) in the chamber wall ( ) at the center of the opening ( ) in the sputtering target. A Faraday type shield ( ) physically shields the window to prevent coating material from coating the window, while allowing the inductive coupling of energy from the coil into the processing space. The location of the coil in the plane of the target or behind the target allows the target-to-wafer spacing to be chosen to optimize film deposition rate and uniformity, and also provides for the advantages of a ring-shaped source without the problems associated with unwanted deposition in the opening at the target center.

Method and apparatus for ionized physical vapor deposition

Ionized physical vapor deposition (IPVD) is provided by a method of apparatus for sputtering conductive metal coating material from an annular magnetron sputtering target. The sputtered material is ionized in a processing space between the target and a substrate by generating a dense plasma in the space with energy coupled from a coil located outside of the vacuum chamber behind a dielectric window in the chamber wall at the center of the opening in the sputtering target. Faraday type shields physically shield the window to prevent coating material from coating the window, while allowing the inductive coupling of energy from the coil into the processing space. The location of the coil in the plane of the target or behind the target allows the target to wafer spacing to be chosen to optimize film deposition rate and uniformity, and also provides for the advantages of a ring-shaped source without the problems associated with unwanted deposition in the opening at the target center.

An ionized physical vapor deposition method and apparatus are provided which employs a magnetron magnetic field produced by cathode magnet structure behind a sputtering target to produce a main sputtering plasma, and an RF inductively coupled field produced by an RF coil outside of and surrounding the vacuum of the chamber to produce a secondary plasma in the chamber between the target and a substrate to ionize sputtered material passing from the target to the substrate so that the sputtered material can be electrically or magnetically steered to arrive at the substrate at right angles. A circumferentially interrupted shield or shield structure in the chamber protects the window from material deposits. A low pass LC filter circuit allows the shield to float relative to the RF voltage but to dissipate DC potential on the shield. Advantages provided are that loss of electrons and ions from the secondary plasma is prevented, preserving plasma density and providing high ionization fraction of the sputtered material arriving at the substrate.

Method and apparatus for increasing the metal ion fraction in ionized

A method of minimizing intragranular oxidation of TiON and providing a low resistivity film that provides for highly textured metal overlayers. The method provides an in situ diffusion barrier for subsequent high temperature metal deposition or processes. An in situ process eliminates the need for a fortification anneal immediately following the barrier deposition, thus reducing the number of metal processing steps and providing for a more economical process or for subsequent high temperature metal deposition. The surface properties of the TiON allow for improved texture in those metal overlayers as well as low diffusion barrier resistivity.

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Scottsdale, AZ, United States of America

Bruce David Gittleman