International Business Machines Corporation

Arne Watson Ballamine

Kevin K Chan

Douglas Duane Coolbaugh

Donna Kaye Johnson

Reliable HTO (High Temperature Oxide) dielectrics are provide by a rapid thermal chemical vapor deposition (RTCVD) process in which a low pressure and a high ratio of reactants, e.g., oxygen-containing gas to silane-containing gas, is employed. Specifically, the reliable HTO is formed by a rapid thermal chemical vapor deposition at temperatures of from about 500&deg; C. or above, said rapid thermal chemical vapor deposition process being carried out at a pressure of less than 80 Torr and in the presence of at least one oxygen-containing reactant and at least one silane-containing reactant, said reactants having a ratio of oxygen-containing to silane-containing of about 25:1 or greater. Semiconductor devices such as capacitors and transistors that include at least a layer of the high temperature oxide of the present invention used as a dielectric material are also provided.

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Gold Spring, NY, United States of America

Arne Watson Ballamine