Lsi Logic Corporation

Lsi Corporation

Avago Technologies International Sales Pte. Limited

Anwar Ali

Tauman T Lau

Kalyan Doddapaneni

Max M Yeung

Julie Beatty

Wei T Huang

Qwai Hoong Low

Ken Nguyen

Ramaswamy Ranganathan

Benjamin Mbouombouo

Wilson Leung

Bo Shen

Nenad Miladinovic

Farshad Ghahghahi

Edwin M Fulcher

Maad A Al-Dabagh

Prasad Subbarao

Radoslav Ratchkov

Thomas Mathews Antisseril

Stan Mihelcic

James G Monthie

Hiroshi Ishikawa

Bing Yi

Mike Teh-An Liang

Gokulnath Sulur

Max M Young

Virendra Patel

A system includes a substrate comprising a first circuit. The system also includes an integrated circuit formed in a first die disposed on the substrate. The integrated circuit includes at least a processor, a controller, and a first memory interface. The first memory interface is located in a first edge of the first die and is configured to couple to the first circuit. The system also includes a first buffer circuit formed in a second die disposed on the interposer substrate adjacent to the first edge of the first die. The first buffer circuit includes a second memory interface configured to couple to the first connection circuit. The system further includes multiple memory modules disposed on the second die. Each of the multiple memory modules at least partially share the second memory interface to communicate with the integrated circuit.

Aggregation of multiple memory modules for a system-on-chip

Disclosed is a flipchip scheme where power and ground bumps are arranged in a striped configuration. Specifically, there are a plurality of lines of power bumps, and a plurality of lines of ground bumps. Each line of power bumps is interconnected by a mesh core power bus, and each line of ground bumps is interconnected by a mesh core ground bus. The busses are shorted across the bumps without having to use metal tab extensions. This arrangement provides that: signal routing can be provided between the lines of bumps; and/or the mesh core power busses can be provided as being wider in order to provide improved power mesh performance and/or in order to reduce or eliminate the metal required on the second top-most metal layer.

Flipchip bump patterns for efficient I-mesh power distribution schemes

The present invention is directed to methods for disabling unused IO resources in a platform-based integrated circuit. A slice is received from a vendor. The slice includes an IO circuit unused by a customer. The IO circuit is disabled. For example, when the IO circuit is desired to be tied to a power source, a primary input/output pin of the IO circuit is shorted to a power bus of the IO circuit. When the IO circuit is desired to be tied to a ground source, a primary input/output pin of the IO circuit is shorted to a ground bus of the IO circuit. When the IO circuit is desired to be left floated, a primary input/output pin of the IO circuit is not connected to any bonding pad cell of the slice. Next, the IO circuit is removed from the customer's logic design netlist. The IO circuit is inserted in the vendor's physical design database.

Disabling unused IO resources in platform-based integrated circuits

An integrated circuit includes a number of probe pads arranged in a staggered manner in a core region of the integrated circuit and a number of bond pads in an Input/Output (I/O) region surrounding the core region. The core region includes logic circuitry therein, and the I/O region is configured to enable the core region to communicate with one or more external circuit(s) through the number of bond pads. The integrated circuit also includes a die metal interconnect separating a bond pad area in the I/O region from a probe pad area in the core region. A dimension of the die metal interconnect and/or a position of the die metal interconnect between the probe pad area and the bond pad area is variable.

Separate probe and bond regions of an integrated circuit

A method and/or an apparatus of power ring positioning to minimize crosstalk are disclosed. In one embodiment, a method includes generating an array of fingers between a power ring and a die, applying a signal wire between a bond pad of the die and a particular finger of the array of fingers, and applying a shielding wire between an adjacent bond pad and the power ring, such that the shielding wire is longer than the signal wire and does not couple to any of the array of fingers. The shielding wire may be placed between adjacent ones of the signal wire to minimize crosstalk between the adjacent ones of the signal wire.

Method and apparatus of power ring positioning to minimize crosstalk

A method for electrically coupling a bond pad of an integrated circuit such as a field programmable device, an application-specific integrated circuit, or a rapid chip with an input/output device is disclosed. The bond pad is provided with a plurality of metal layers configurable for making a connection with the input/output device. The bond pad is then coupled to the input/output device with an interconnect structure. The method for electrically coupling the bond pad to the input/output device allows the customer to configure the power and ground pad counts after the slice is created.

Power configuration method for structured ASICs

An integrated circuit with a monolithic semiconducting substrate formed in a chip, where the chip has a peripheral edge, a backside, and an opposing top on which circuitry is formed. A first ring of bonding pads is formed along at least a portion of the peripheral edge. At least one of the bonding pads is configured as a power pad, and at least one of the bonding pads is configured as a ground pad. An intermediate power bus is disposed interior to the first ring of bonding pads on the chip, and forms no direct electrical connections to any core devices. An intermediate ground bus is also disposed interior to the first ring of bonding pads on the chip, and forms no direct electrical connections to any core devices. A power pad wire forms an exclusive electrical connection between the power pad and the intermediate power bus. A ground pad wire forms an exclusive electrical connection between the ground pad and the intermediate ground bus. A power strap forms an electrical connection between the intermediate power bus and a power mesh. A ground strap forms an electrical connection between the intermediate ground bus and a ground mesh.

Pad current splitting

A computer-implemented method for creating slotted metal structures in a semiconductor design is disclosed. Aspects of the present invention include providing a library of different types of pre-slotted building block elements. Thereafter, during chip design, a plurality of the elements are selected from the library and placed in the design in abutment to form a composite slotted metal structure.

Cell-based method for creating slotted metal in semiconductor designs

The present invention is directed to methods for optimizing package and silicon co-design of an integrated circuit. A composite bump pattern for an integrated circuit is created based on a first library including at least one bump pattern template. PCB and Die constraints of the integrated circuit are then reviewed. A partial package design for the integrated circuit is generated based on a second library including at least one partial package template. A partial silicon design for said integrated circuit is started. A full package design for the integrated circuit is then completed. A full silicon design for the integrated circuit is completed.

Methods for optimizing package and silicon co-design of integrated circuit

A method and computer program are disclosed for reducing routing congestion in an integrated circuit design that include steps of: (a) receiving as input a design for an integrated circuit die having an inner metal layer and a top metal layer wherein the design includes electrical constraints of each of a plurality of I/O circuits in the integrated circuit die; (b) selecting a number of vias for a via array to form an electrical connection between the inner metal layer and the top metal layer of the integrated circuit die that connects a solder bump formed on the top metal layer to a corresponding one of the plurality of I/O circuits wherein the number of vias is selected to satisfy the electrical constraints of the corresponding one of the plurality of I/O circuits; and (c) generating as output the number of vias determined for the via array.

Method of sizing via arrays and interconnects to reduce routing congestion in flip chip integrated circuits

The present invention provides a system for implementing a configurable integrated circuit (IC). Aspects of the invention include an IC die; a plurality of input/outputs (I/Os) coupled to the IC die; and a plurality power planes coupled to the IC die for providing power to the plurality of I/Os at different voltages. The plurality of power planes are configured concentrically around the IC die so that any one or more of the I/Os at any location on the IC die can be individually configured to connect to any of the power planes. As a result, any number of I/Os available on the IC die can operate at a given voltage.

System for implementing a configurable integrated circuit

An integrated circuit having a crack detection structure. A control structure is formed having interleaved electrically conductive layers and non electrically conductive layers in a vertical orientation. Electrically conductive vias are disposed vertically through all of the non electrically conductive layers, which vias electrically connect all of the electrically conductive layers one to another. A test structure is formed having a bonding pad for probing and bonding, with underlying interleaved electrically conductive layers and non electrically conductive layers disposed in a vertical orientation. At least one of the non electrically conductive layers has no vias formed therein, simulating active circuitry under other bonding pads of the integrated circuit. At least one of the interleaved electrically conductive layers of the control structure extends from within the control structure to within the test structure as a sensing layer. The sensing layer immediately underlies the at least one of the non electrically conductive layers in the test structure that has no vias formed therein. Thus, a crack in the at least one of the non electrically conductive layers in the test structure that has no vias formed therein is detectable as a leakage current between the bonding pad of the test structure and a top most electrically conductive layer of the control structure.

Test structure for detecting bonding-induced cracks

Various integrated circuits (ICs) are provided. One IC includes bonding pads and an input output (I/O) region surrounding a core region. The I/O region includes I/O cells having a width approximately equal to or less than a width of the bonding pads. The IC also includes core logic arranged within the I/O region. Another IC includes four rows of bonding pads. Each row is arranged parallel to a different side of a core region. I/O sub-regions are arranged proximate each side of the core region. Each I/O sub-region includes I/O cells and core logic. An additional IC includes a first I/O region surrounding a core region and a second I/O region surrounding the first I/O region. The IC also includes bonding pads arranged outside of I/O cells in the first and second I/O regions. A width of the I/O cells is approximately equal to a pitch of the bonding pads.

Growing community of inventors

San Jose, CA, United States of America

Anwar Ali