Stats Chippac Pte. Ltd.

Utac Headquarters Pte. Ltd.

St Assembly Test Services Inc.

United Test and Assembly Center Limited

Antonio Bambalan Dimaano, Jr

Dioscoro A Merilo

Heap Hoe Kuan

Seng Guan Chow

Il Kwon Shim

Sheila Rima C Magno

Byung Tai Do

Sheila Marie L Alvarez

Jeffrey David Punzalan

Henry Descaizo Bathan

Frederick Rodriguez Dahilig

Roel Adeva Robles

Dennis Guillermo

Saravuth Sirinorakul

Nathapong Suthiwongsunthorn

Tsz Yin Ho

Yong Bo Yang

Zigmund Ramirez Camacho

Pandi Chelvam Marimuthu

Rui Huang

Jose Alvin Caparas

John Briar

Leocadio Morona Alabin

Robinson Quiazon

Weddie Pacio Aquien

Dzafir Bin Mohd Shariff

Preecha Joymak

Librado Amurao Gatbonton

Chiu Hsieh Ong

Beng Yee Teh

Seung Guen Park

Erick Dahilig

Nataporn Charusabha

Semiconductor packages having an electromagnetic interference (EMI) shielding layer and methods for forming the same are disclosed. The method includes providing a base carrier defined with an active region and a non-active region. A fan-out redistribution structure is formed over the base carrier. A die having elongated die contacts are provided. The die contacts corresponding to conductive pillars. The die contacts are in electrical communication with the fan-out redistribution structure. An encapsulant having a first major surface and a second major surface opposite to the first major surface is formed. The encapsulant surrounds the die contacts and sidewalls of the die. An electromagnetic interference (EMI) shielding layer is formed to line the first major surface and sides of the encapsulant. An etch process is performed after forming the EMI shielding layer to completely remove the base carrier and singulate the semiconductor package.

Semiconductor packages with electromagnetic interference shielding

Embodiments of the present invention are directed to a semiconductor package with improved thermal performance. The semiconductor package includes a package substrate comprising a top substrate surface and a bottom substrate surface. The package substrate comprises a thickness extending from the top substrate surface to the bottom substrate surface. A heat spreader is disposed on the top substrate surface. The heat spreader comprises a thickness extending from a top planar surface to a bottom planar surface of the heat spreader. The top planar surface of the heat spreader is defined with a die region and a non-die region surrounding the die region. A semiconductor die is directly disposed on the top planar surface of the heat spreader in the die region. The thickness of the heat spreader is greater relative to the thickness of the package substrate.

Semiconductor package with a heat spreader and method of manufacturing thereof

Device and method of forming the device are disclosed. A device includes a buildup package substrate with top and bottom surfaces and a plurality of interlevel dielectric (ILD) layers with interconnect structures printed layer by layer and includes a die region and a non-die region on the top surface. A semiconductor die is disposed in the die and non-die regions of the package substrate and is electrically connected to the plurality of interconnect structures via a plurality of wire bonds. A plurality of conductive elements are disposed on the bottom surface of the package substrate and a dielectric layer encapsulates the semiconductor die, the wire bonds and the top surface of the buildup package substrate.

Multi-layer leadless semiconductor package and method of manufacturing the same

A method of and device for making a semiconductor package. The method comprises etching a first side of a metallic piece forming a leadframe with one or more wire bonding pads, applying a first protective layer on the first side, etching a second side of the metallic piece forming one or more conductive terminals, and applying a second protective layer on the second side. The semiconductor package comprises wire bonding pads in pillars structure surrounding a die attached to the leadframe. One or more terminals are on the bottom side of the semiconductor package.

Semiconductor package having routing traces therein

Embodiments of the present invention are directed to leadframe area array packaging technology for fabricating an area array of I/O contacts. A manufactured package includes a polymer material substrate, an interconnect layer positioned on top of the polymer material substrate, a die coupled to the interconnect layer via wire bonds or conductive pillars, and a molding compound encapsulating the die, the interconnect layer and the wire bonds or conductive pillars. The polymer material is typically formed on a carrier before assembly and is not removed to act as the substrate of the manufactured package. The polymer material substrate has a plurality of through holes that exposes the interconnect layer at predetermined locations and enables solder ball mounting or solder printing directly to the interconnect layer. In some embodiments, the semiconductor package includes a relief channel in the polymer material substrate to improve the reliability performance of the manufactured package.

Leadframe area array packaging technology

An integrated circuit package system is provided including an integrated circuit package system including an integrated circuit and a lead frame. The lead frame has a multi-surface die attach pad and the integrated circuit is mounted to the multi-surface die attach pad.

Integrated circuit package system with multi-surface die attach pad

An integrated circuit package system that includes: providing an electrical interconnect system including a support structure and a lead-finger system; processing a top edge of the support structure along an outermost periphery thereof, to include a recess for preventing mold bleed, the recess surrounded by the lead finger system; and encapsulating the recess and the electrical interconnect system with an encapsulation material to interlock the encapsulation material.

Integrated circuit package system employing a support structure with a recess

An integrated circuit package system includes: a semiconductor chip; a stress-relieving layer on the semiconductor chip; an adhesion layer on the stress relieving layer; and electrical interconnects bonded to the adhesion layer.

Integrated circuit package system with warp-free chip

A semiconductor package system including: providing a substrate having a thermal relief thereon; depositing a mask on the substrate and the thermal relief, the mask deposited on the thermal relief and having a regular pattern to partially cover the thermal relief; and die attaching a semiconductor die over the thermal relief.

Semiconductor package system with patterned mask over thermal relief

A stackable integrated circuit package system includes: forming a first integrated circuit die having a small interconnect and a large interconnect provided thereon; forming an external interconnect, having an upper tip and a lower tip, from a lead frame; mounting the first integrated circuit die on the external interconnect with the small interconnect on the lower tip and below the upper tip; and encapsulating around the small interconnect and around the large interconnect with an exposed surface.

Stackable integrated circuit package system with multiple interconnect interface

A method for manufacturing an integrated circuit package system includes: providing a base package having a first integrated circuit with an inner lead on a periphery thereof and connected thereto with interconnects, and the inner lead partially encapsulated by an inner encapsulation; mounting an outer lead on the periphery of the base package; mounting a second integrated circuit above the base package and connected to the outer lead with the interconnects; and partially encapsulating, the base package and the outer leads with an outer encapsulation leaving a bottom surface of the inner lead and a bottom surface of the outer lead exposed.

Quad flat pack in quad flat pack integrated circuit package system and method for manufacturing thereof

A method of manufacturing an integrated circuit packaging system includes: providing an inner lead and an outer lead, the inner lead having an inner peripheral side with a non-linear contour; forming a bump contact, having a groove in and a mesa from the inner lead or the outer lead, the groove adjacent to the mesa; mounting a first device adjacent to the inner lead; connecting a second device to the mesa; and forming an encapsulation material over the first device, the inner lead, and the outer lead and covering the second device.

Integrated circuit package system employing device stacking

A method of manufacture of an integrated circuit package system that includes: providing an electrical interconnect system including an inner lead-finger system and an outer lead-finger system; stacking a first device, a second device, and a third device between and over the electrical interconnect system; connecting the first device and the second device to the inner lead-finger system; and connecting the third device to the outer lead-finger system.

Integrated circuit package system employing device stacking and method of manufacture thereof

A stackable integrated circuit package system includes: a substrate having a first side and a second side opposite the first side, the substrate having a cavity provided therein; a first integrated circuit die in the cavity with a first interconnect extending out from the cavity without connection and a second interconnect connected to the first side; a first mold compound to cover the first integrated circuit die, the second interconnect, and a portion of the first interconnect; a second integrated circuit die mounted to the first integrated circuit die with a third interconnect connected to the second side; a second mold compound to cover the second integrated circuit die and the third interconnect; and external interconnects, not encapsulated by the second encapsulant, mounted on the second side.

Growing community of inventors

Singapore, Singapore

Antonio Bambalan Dimaano, Jr