Lsi Corporation

Lsi Logic Corporation

Alexandre Andreev

Ranko L Scepanovic

Andrey Nikitin

Ilya Vladimirovich Neznanov

Anatoli Aleksandrovich Bolotov

Igor A Vikhliantsev

Elyar Eldarovich Gasanov

Ivan Pavisic

Mikhail I Grinchuk

Pavel Anatolyevich Panteleev

Lav D Ivanovic

Sergey Vladimirovich Gribok

Sergei B Gashkov

A method and apparatus are provided for using a memory timing database. A plurality of characterization memories are defined, which can be mapped to a memory resource. Each characterization memory has different memory parameters. A plurality of variants of tiling each characterization memory to the memory resource are also defined. Timing characteristics of each tiling variant of each characterization memory are stored in the memory timing database for the memory resource based on sets of input ramptimes and output loads.

Method and apparatus for generating memory models and timing database

An apparatus including a multiplier circuit and a multiplexing circuit. The multiplier circuit may be configured to multiply a first multiplicand and a second multiplicand based on a programmable base value and generate a plurality of intermediate values, each intermediate value representing a result of the multiplication reduced by a respective irreducible polynomial. The multiplexing circuit may be configured to generate an output in response to the plurality of intermediate values received from the multiplier circuit and the programmable base value.

Universal Galois field multiplier

A method and apparatus are provided for creating and using a memory timing database. A plurality of characterization memories are defined, which can be mapped to a memory resource. Each characterization memory has different memory parameters. A plurality of variants of tiling each characterization memory to the memory resource are also defined. Timing characteristics of each tiling variant of each characterization memory are stored in the memory timing database for the memory resource based on sets of input ramptimes and output loads.

A syndrome calculator receives an input codeword and calculates a first set of syndromes. A syndrome transform receives the first set of syndromes having and determines a second set of syndromes. The second set of syndromes is based on the first set of syndromes. The second set of syndromes has number of syndromes that is less than the number of syndromes in the first set of syndromes. A key equation solver receives the second set of syndromes and produces an indication of zero or more error locations and an indication of zero or more error values.

Reed-solomon decoder with a variable number of correctable errors

A fixed length Reed-Solomon encoder is configured to produce a first fixed number of redundant symbols. The fixed length Reed-Solomon encoder is configured with an encoding polynomial that is fixed. A symbol preprocessor maps each input data symbol to a transformed input data symbol. A symbol postprocessor maps a second fixed number of redundant symbols output from the fixed length Reed-Solomon encoder to a set of redundant symbols. The second fixed number of redundant symbols is less than the first fixed number of redundant symbols.

Variable redundancy reed-solomon encoder

A memory collar including a first circuit and a second circuit. The first circuit may be configured to generate one or more data sequences in response to one or more test commands. The one or more data sequences may be presented to a memory during a test mode. The second circuit may be configured to pre-process one or more outputs generated by the memory in response to the one or more data sequences.

Data controlling in the MBIST chain architecture

An apparatus including a controller configured to present one or more commands and receive one or more responses, a plurality of transport circuits configured to receive one of the commands, present the responses, and generate one or more control signals, and a plurality of memory-controlling circuits, each coupled to a respective one of the plurality of transport circuits and configured to generate one or more memory access signals in response to the one or more control signals, receive one or more memory output signals from a respective memory in response to the one or more memory access signals, and generate the responses in response to the one or more memory output signals. Each respective memory may be independently sized. The controller generally provides a common testing routine for each respective memory that may be adjusted for the size of each respective memory by the memory-controlling circuits.

Transport subsystem for an MBIST chain architecture

A method and apparatus are provided for receiving a list of design memories, wherein each type of design memory in the list has a name and at least one instance. A pre-placement model is associated with each named memory type in the list. The design memories in the list are mapped to an integrated circuit layout pattern, wherein at least one memory type comprises first and second instances that are mapped differently from one another. After mapping, at least one of the first and second instances is renamed to have a different name than the other. A post-placement model is then associated with each named memory type in the list, including a separate model for each renamed design memory.

Method and apparatus for mapping design memories to integrated circuit layout

A memory collar includes a first circuit, a second circuit and a third circuit. The first circuit may be configured to generate a first control signal, a second control signal and a third control signal in response to one or more test commands. The second circuit may be configured to generate a fourth control signal in response to said third control signal and the fourth control signal. The third circuit may be configured to generate one or more address sequences. The one or more address sequences are presented to a memory during a test mode.

Address controlling in the MBIST chain architecture

The present invention concerns an apparatus including a modular memory and an address locator circuit. The modular memory may be configured to generate a current address signal, a first data output signal and a second data output signal in response to a first port address signal, a second port address signal, an initial state parameter, a target state parameter, a first port enable signal, a second port enable signal, a write enable signal, a data input signal, a first location signal and a second location signal. The address locator circuit may be configured to generate the first location signal and the second location signal in response to the first port address signal, the second port address signal and the current address signal.

Generation of test sequences during memory built-in self testing of multiple memories

A process and apparatus are provided for tiling objects, such as design memories, in one or more respective object locations in a layout pattern. For each object, the following steps are performed recursively based on a comparison of at least one of a capacity and a width of the object and that of the respective object location: (1) do nothing; (2) reconfigure the object to have a different capacity and/or width; and (3) split the object into two or more separate objects. The recursion is repeated for each reconfigured object and each separated object.

Method and apparatus for tiling memories in integrated circuit layout

A master controller for an RRAM subsystem. An interface communicates with at least one RRAM controller. A main control unit selects and implements test and repair operations on the RRAM subsystem through the RRAM controller. A timer determines a maximum number of test and repair operations that can be implemented within a given time. Thus, a master controller is included in the RRAM subsystem. The master controller has a relatively simple interface, and performs test and repair operations on the RRAM subsystem. The advantages of using the master controller include an elimination of additional test ports, simplification of the process of preparing the test vectors for RRAM testing, and the master controller is able to accumulate test results and initiate repairs based on those results. In this manner, the RRAM subsystem has a self-repair functionality.

Master controller architecture

A method of tiling a customer memory design to configurable memory blocks within a standardized memory matrix. A customer memory capacity and a customer memory width is determined for the customer memory design, and a standardized memory capacity and a standardized memory width is determined for the configurable memory blocks. The customer memory capacity and the customer memory width are selectively transformed by inverse factors based at least in part on a comparison of the customer memory capacity and the standardized memory capacity. Case independent blocks are formed within the configurable memory blocks, where the case independent blocks include gate structures formed in a standardized array in a substrate in which the customer memory design is to be implemented. Case dependent blocks are formed within the configurable memory blocks, where the case dependent blocks are electrically conductive routing layers that selectively connect the case independent blocks according to the transformation of the customer memory design.

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San Jose, CA, United States of America

Alexandre Andreev