Most Cited Patents

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a schematic structural view of a TFT produced for evaluating an amorphous oxide semiconductor used for an optical sensor of the present invention.
3,541 citations – Sensor and image pickup device.
Date of Patent: Nov. 18, 2008

Inventors: Keishi SaitoHideo HosonoToshio KamiyaKenji Nomura.

A sensor for detecting a received electromagnetic wave comprising a first electrode, a second electrode and an amorphous oxide layer interposed between the first electrode and the second electrode.


image 157
3,539 citations – High-electron mobility transistor with zinc oxide.
Date of Patent: Sep. 12, 2006

Inventors: Jeff NauseShanthi Ganesan.

A zinc oxide (ZnO) FET uses a gate-insulating layer (aluminum nitride/aluminum gallium nitride or magnesium zinc oxide) to achieve high input amplitude. It operates in enhancement mode, like a silicon MOSFET, forming an inversion layer. The excellent insulation characteristics of the gate insulating layer increase the Schottky barrier, enabling the large input amplitude.

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