The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 03, 2025
Filed:
Jun. 30, 2022
The Curators of the University of Missouri, Columbia, MO (US);
Jinglu Tan, Columbia, MO (US);
Nilesh Salvi, Columbia, MO (US);
THE CURATORS OF THE UNIVERSITY OF MISSOURI, Columbia, MO (US);
Abstract
A system and method for measuring one or more viscoelastic properties of a material under measurement is disclosed. The system includes an emitter-observer transducer pair separated by the material. A signal processing assembly is operable to (i) apply a plurality of excitation signals to the emitter transducer, wherein each of the excitation signals comprises a continuous-wave sinusoidal waveform, (ii) record a plurality of output signals at the observer transducer, wherein each of the output signals corresponds to one of the excitation signals, (iii) analyze the output signals to measure the sound speed of the material, and (iv) determine the viscoelastic properties of the material under measurement by optimizing the parameters of an infinite echo model. The system provides a non-destructive approach for in-situ measurement of viscoelastic material properties.