The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2025
Filed:
Dec. 07, 2022
Case Western Reserve University, Cleveland, OH (US);
Anant Madabhushi, Shaker Heights, OH (US);
Andrew Janowczyk, East Meadow, NY (US);
Case Western Reserve University, Cleveland, OH (US);
Abstract
Embodiments include accessing a set of digital pathology (DP) images having an imaging parameter; applying a low-computational cost histology quality control (HistoQC) pipeline to the DP images, where the low-computational cost HistoQC pipeline computes a first set of image metrics associated with a DP image, and assigns the DP image to a first or a second, different cohort based on the imaging parameter and the first set of image metrics; applying a first, higher-computational-cost HistoQC pipeline to a member of the first cohort; applying a second, different higher-computation-cost HistoQC pipeline to a member of the second cohort; where the first or second, higher-computational-cost HistoQC pipeline determines an artifact-free region of the member of the first or second cohort, respectively, and classifies the member of the first or second cohort, respectively, as suitable or unsuitable for downstream computation or diagnostic analysis based, at least in part, on the artifact free region.