The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2019

Filed:

Oct. 23, 2016
Applicant:

Dacadoo Ag, Zurich, CH;

Inventor:

Peter Ohnemus, Herrliberg, CH;

Assignee:

dacadoo ag, Zurich, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/00 (2005.12); C40B 30/02 (2005.12); G06T 7/00 (2016.12); G06F 19/00 (2017.12); G06F 19/20 (2010.12); H04N 1/60 (2005.12); G16B 35/00 (2018.12); G16B 25/00 (2018.12); G16C 20/60 (2018.12); G16C 20/90 (2018.12);
U.S. Cl.
CPC ...
G16B 35/00 (2019.01); G06T 7/0012 (2012.12); G16B 25/00 (2019.01); G16C 20/60 (2019.01); G06T 2207/10024 (2012.12); G06T 2207/30072 (2012.12); G16C 20/90 (2019.01); H04N 1/6033 (2012.12);
Abstract

A remote microarray analysis system, method and apparatus for use in the remote analysis of a chemical compound microarray supported on a substrate is disclosed. Pixel image data is received from a remote location including image data that depicts (a) a calibration scale associated with the substrate and (b) the microarray. A transformation action of said pixel data corresponding to the calibration scale is determined and the received image data corresponding to at least the microarray is adjusted by applying the transformation action. The adjusted image of the microarray is compared with a database of stored microarray pixel data to extract information from said image.


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