The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 06, 2019

Filed:

Jun. 26, 2013
Applicant:

Xenogenic Development Limited Liability Company, Wilmington, DE (US);

Inventors:

Tingkai Li, Camas, WA (US);

Sheng Teng Hsu, Camas, WA (US);

David R. Evans, Beaverton, OR (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/20 (2005.12); H01L 27/24 (2005.12); G11C 13/00 (2005.12); H01L 29/66 (2005.12); H01L 29/872 (2005.12); H01L 45/00 (2005.12);
U.S. Cl.
CPC ...
H01L 21/20 (2012.12); G11C 13/0007 (2012.12); H01L 27/2409 (2012.12); H01L 29/66143 (2012.12); H01L 29/872 (2012.12); H01L 45/04 (2012.12); H01L 45/1233 (2012.12); G11C 2213/31 (2012.12); H01L 45/147 (2012.12);
Abstract

A method is provided for forming a metal/semiconductor/metal (MSM) back-to-back Schottky diode from a silicon (Si) semiconductor. The method deposits a Si semiconductor layer between a bottom electrode and a top electrode, and forms a MSM diode having a threshold voltage, breakdown voltage, and on/off current ratio. The method is able to modify the threshold voltage, breakdown voltage, and on/off current ratio of the MSM diode in response to controlling the Si semiconductor layer thickness. Generally, both the threshold and breakdown voltage are increased in response to increasing the Si thickness. With respect to the on/off current ratio, there is an optimal thickness. The method is able to form an amorphous Si (a-Si) and polycrystalline Si (polySi) semiconductor layer using either chemical vapor deposition (CVD) or DC sputtering. The Si semiconductor can be doped with a Group V donor material, which decreases the threshold voltage and increases the breakdown voltage.


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