The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2018

Filed:

May. 26, 2015
Applicant:

Sony Corporation, Tokyo, JP;

Inventors:

Rintaro Koda, Tokyo, JP;

Takahiro Arakida, Kanagawa, JP;

Yuji Masui, Miyagi, JP;

Tomoyuki Oki, Kanagawa, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 31/12 (2005.12); H01S 5/026 (2005.12); H01S 5/183 (2005.12); H01S 5/042 (2005.12);
U.S. Cl.
CPC ...
H01S 5/0262 (2012.12); H01S 5/18311 (2012.12); H01S 5/0264 (2012.12); H01S 5/0425 (2012.12); H01S 5/18375 (2012.12);
Abstract

The present invention provides a semiconductor device realizing reduced occurrence of a defect such as a crack at the time of adhering elements to each other. The semiconductor device includes a first element and a second element adhered to each other. At least one of the first and second elements has a pressure relaxation layer on the side facing the other of the first and second elements, and the pressure relaxation layer includes a semiconductor part having a projection/recess part including a projection projected toward the other element, and a resin part filled in a recess in the projection/recess part.


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