The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 20, 2017

Filed:

Mar. 25, 2014
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Naftali Sommer, Rishon-Le-Zion, IL;

Ofir Shalvi, Ra'anana, IL;

Dotan Sokolov, Ra'anana, IL;

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2005.12); G06F 11/30 (2005.12); G11C 8/20 (2005.12); G11C 27/00 (2005.12); G11C 11/56 (2005.12);
U.S. Cl.
CPC ...
G06F 11/1068 (2012.12); G11C 8/20 (2012.12); G11C 11/56 (2012.12); G11C 11/5642 (2012.12); G11C 27/005 (2012.12);
Abstract

A method for operating a memory () includes storing data, which is encoded with an Error Correction Code (ECC), in analog memory cells () of the memory by writing respective analog input values selected from a set of nominal values to the analog memory cells. The stored data is read by performing multiple read operations that compare analog output values of the analog memory cells to different, respective read thresholds so as to produce multiple comparison results for each of the analog memory cells. At least two of the read thresholds are positioned between a pair of the nominal values that are adjacent to one another in the set of the nominal values. Soft metrics are computed responsively to the multiple comparison results. The ECC is decoded using the soft metrics, so as to extract the data stored in the analog memory cells.


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