The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US RE46311 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 13, 2017

Filed:

Mar. 10, 2015
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventor:

Yusuke Kawaguchi, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/788 (2005.12); H01L 29/78 (2005.12); H01L 29/423 (2005.12); H01L 29/06 (2005.12); H01L 29/40 (2005.12);
U.S. Cl.
CPC ...
H01L 29/7813 (2012.12); H01L 29/0626 (2012.12); H01L 29/4236 (2012.12); H01L 29/4238 (2012.12); H01L 29/7805 (2012.12); H01L 29/7808 (2012.12); H01L 29/0696 (2012.12); H01L 29/407 (2012.12); H01L 29/42368 (2012.12);
Abstract

According to one embodiment, a semiconductor device, includes an element unit including a vertical-type MOSFET, the vertical-type MOSFET in including a first semiconductor layer, a second semiconductor layer, a third semiconductor layer, a fourth semiconductor layer, a fifth semiconductor layer sequentially stacked in order, an impurity concentration of the second semiconductor layer being lower than the first semiconductor layer, an insulator covering inner surfaces of a plurality of trenches, the adjacent trenches being provided with a first interval in between, and a diode unit including basically with the units of the element unit, the adjacent trenches being provided with a second interval in between, the second interval being larger than the first interval.


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