The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2011
Filed:
Dec. 20, 2006
Yvan G. Leclerc, Fremont, CA (US);
Margaret Frances Davies, Legal Representative, Palo Alto, CA (US);
Quang-tuan Luong, San Jose, CA (US);
Pascal Fua, Lausanne, CH;
Yvan G. LeClerc, Fremont, CA (US);
Margaret Frances Davies, legal representative, Palo Alto, CA (US);
Quang-Tuan Luong, San Jose, CA (US);
Pascal Fua, Lausanne, CH;
Transpacific Kodex, LLC, Wilmington, DE (US);
Abstract
The present invention provides a method for measuring the self-consistency of inference algorithms. The present invention provides a method for measuring the accuracy of an inference algorithm that does not require comparison to ground truth. Rather, the present invention pertains to a method for measuring the accuracy of an inference algorithm by comparing the outputs of the inference algorithm against each other. Essentially, the present invention looks at how well the algorithm applied to many of the different observations gives the same answer. In particular, the present invention provides a method that is not time and labor intensive and is cost effective.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile