The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2011

Filed:

Mar. 22, 2001
Applicants:

Paul O. Detwiler, Lawrenceville, GA (US);

Barry M. Mergenthaler, Lawrenceville, GA (US);

Hong Tang, Suwanee, GA (US);

Inventors:

Paul O. Detwiler, Lawrenceville, GA (US);

Barry M. Mergenthaler, Lawrenceville, GA (US);

Hong Tang, Suwanee, GA (US);

Assignee:

NCR Corporation, Duluth, GA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 7/10 (2005.12);
U.S. Cl.
CPC ...
Abstract

A dual aperture optical scanner which produces horizontal, vertical, and diagonal scan patterns. The optical scanner includes a housing having a substantially vertical surface containing a first aperture and a substantially horizontal surface containing a second aperture. A laser diode produces a laser beam. A spinner produces first, second, and third groups of scanning beams. A plurality of pattern mirrors reflects the first group of scanning beams in a substantially horizontal direction through the first aperture, the second group of scanning beams in a substantially downward diagonal direction through the first aperture, and the third group of scanning beams in a substantially vertical direction through the second aperture.


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