The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2011

Filed:

Jun. 20, 2010
Applicants:

Yoshikazu Yamamoto, Osaka, JP;

Motoshi Ito, Osaka, JP;

Hiroshi Ueda, Nara, JP;

Inventors:

Yoshikazu Yamamoto, Osaka, JP;

Motoshi Ito, Osaka, JP;

Hiroshi Ueda, Nara, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/09 (2005.12);
U.S. Cl.
CPC ...
Abstract

Information recording mediaandusable for either a first recording density Dor a second recording density Deach include a user data areain which user data is to be recorded, a first defect management information areain which first defect management information for managing a defect area in the user data area is to be recorded, and a second defect management information areain which second defect management information having an identical content to that of the first defect management information is to be recorded. The first and second defect management information areasandare located such that angles θand θmade by start blocks thereof fulfill the relationships of 150°≦θ≦210° and 150°≦θ≦210° (θin the case of the first recording density, and θin the case of the second recording density).


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