The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 2011

Filed:

Aug. 17, 2009
Applicants:

So-hyun Kim, Suwon-si, KR;

Chang-hoi Koo, Seongnam-si, KR;

Jung-je Son, Seongnam-si, KR;

Yeong-moon Son, Anyang-si, KR;

Inventors:

So-Hyun Kim, Suwon-si, KR;

Chang-Hoi Koo, Seongnam-si, KR;

Jung-Je Son, Seongnam-si, KR;

Yeong-Moon Son, Anyang-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 4/00 (2008.12);
U.S. Cl.
CPC ...
Abstract

A method for measuring/reporting a channel quality in a broadband wireless access communication system. The method for reporting channel qualities of active BS and neighbor BSs measured by an MSS to the active BS when the MSS exists in a specific area covered by the active BS and neighbor BSs in a communication system includes the steps of: a) receiving channel quality report information indicative of channel periods of the channel qualities from the active BS, and receiving channel quality measurement information associated with individual channel qualities of the neighbor BSs and the active BS from the active BS; b) measuring SINRs of the neighbor BSs and the active BS according to the channel quality measurement information; and c) reporting the measured SINRs of the neighbor BSs and the active BS to the active BS.


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