The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2011

Filed:

Jun. 22, 2000
Applicant:

Dominique Morche, Meylan, FR;

Inventor:

Dominique Morche, Meylan, FR;

Assignee:

Fahrenheit Thermoscope LLC, Las Vegas, NV (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 3/06 (2005.12); H03M 1/10 (2005.12); H03M 3/00 (2005.12);
U.S. Cl.
CPC ...
Abstract

The invention concerns a method for compensating the non-linearity of a sigma-delta analog-to-digital converter (A) with quantization at N levels comprising a digital-to-analog converter (). The method comprises a calibrating step which consists in transforming the multibit sigma-delta analog-to-digital converter (A) into a sigma-delta analog-to-digital converter with quantization at three levels, then at two levels. The correction values of each level to be corrected are accurately measured. The method also comprises a normal functioning phase which consists, when the sigma-delta an analog-to-digital converter (A) is operating with quantization at N levels, in producing an instantaneous correction of errors of the analog-to-digital converter () using said correction values.


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