The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2008

Filed:

May. 26, 2005
Applicant:

Thomas H. Williams, Longmont, CO (US);

Inventor:

Thomas H. Williams, Longmont, CO (US);

Assignee:

Alta Vocal Data, LLC, Las Vegas, NV (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 23/20 (2005.12);
U.S. Cl.
CPC ...
Abstract

A system for determining a composite signal level at which a signal path begins to generate non-linear distortion. Auses areference test signal, which is preferably a short-duration burst of repeatable broadband energy,thatis passed through the signal path and received on a digital signal acquisition unit. An impaired received reference test signalis comprised ofis formed fromthe transmitted reference test signal, linear distortion components, and non-linear distortion components.The impaired received reference test signal is digitally processed to reveal the non-linear distortion components. The impaired received reference test signal may be processed with a stored reference test signal to find a time-domain impulse response from which the uncorrelated distortion energy can be measured. Alternately, a reference test signal, such as an orthogonal frequency division multiplex (OFDM) reference signal with spectral holes, can be processed in the frequency domain to find the non-linear distortion energy that enters the spectral holes. Alternately, a transfer function of a signal path, showing an output voltage as a function of an input voltage, can be generated from a two-burst waveform comprised of a clipping high-level sinewave and non-clipping low-level sinewave. As the reference test signals are elevated in level, the magnitude of the non-linear distortion products can typically be observed to increase.


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