The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2008

Filed:

Dec. 21, 2003
Applicants:

Hiromi Nanba, Tokyo, JP;

Tohru Mizutani, Kawasaki, JP;

Makoto Ikeshita, Kawasaki, JP;

Masato Takeyabu, Sapporo, JP;

Inventors:

Hiromi Nanba, Tokyo, JP;

Tohru Mizutani, Kawasaki, JP;

Makoto Ikeshita, Kawasaki, JP;

Masato Takeyabu, Sapporo, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 5/12 (2005.12);
U.S. Cl.
CPC ...
Abstract

An evaluation circuitrepeats processing in which an output VD thereof is reset, there is obtained repeatedly given times a difference between sampled output voltages Vo of a replica circuitR when respective times tand thave elapsed after a voltage Vi is step-inputted to the replica circuitR, and the differences are successively summed. A comparator circuitcompares a difference cumulation voltage VD with a reference voltage VS. A bias adjustment circuitsteps up the bias currents of the replica circuitR and an adjusted circuitat every this given times if VD>VS, and ceases the adjustment if VD<VS.


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