The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2005

Filed:

Feb. 13, 2002
Applicant:

Tor Slettnes, Castro Valley, CA (US);

Inventor:

Tor Slettnes, Castro Valley, CA (US);

Assignee:

Applera Corporation, Foster City, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N015/06 ;
U.S. Cl.
CPC ...
Abstract

A data collection method for scanning a scan window comprising one or more channels is described. In the method of the invention an integrated signal (S) is measured across a scan window including one or more channels using an integrating detector. Next, a velocity-normalized integrated signal (Sn) is determined based on the integrated signal (S) and a scan velocity.


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