The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 1990
Filed:
Jun. 29, 1989
Applicant:
Inventors:
Susan N Vernon, Annandale, VA (US);
Stephen S Lane, Bethesda, MD (US);
Assignee:
The United States of America as represented by the Secretary of the Navy, Washington, DC (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
324240 ; 324232 ; 324241 ; 324242 ;
Abstract
A device for inspection by eddy current methods of materials exhibiting cumferential conductivity. This device finds application for the inspection of filament-wound carbon fiber reinforced composites which do not usually have sufficient conductivity in the axial direction to allow inspection by conventional surface probes while still providing the desired resolution. This device is also useful in inspecting thick-walled circumferentially conductive materials, including metal, where their thickness would require a surface probe of such diameter as to be impractical.