The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 1989
Filed:
Apr. 16, 1989
Applicant:
Inventor:
C Denton Marrs, Ridgecrest, CA (US);
Assignee:
The United States of America as represented by the Secretary of the Navy, Washington, DC (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01B / ;
U.S. Cl.
CPC ...
356237 ; 356153 ;
Abstract
An apparatus for observing defects in and evolution of induced damage on a est surface is created by combining an illumination system with a magnification system. A visible light source is used to illuminate the surface of an optical sample. A test laser system is aligned to illuminate the identical surface areas of the optical sample with light of preselected wavelength (frequency) and intensity. A telescope is focused on the illuminated surface area. The output image of the telescope is fed to a video camera system which in turn is connected to a video tape system.