The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 05, 1989

Filed:

Apr. 29, 1986
Applicant:
Inventor:

Mark G Baciak, Albuquerque, NM (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ; G01B / ;
U.S. Cl.
CPC ...
356363 ; 356345 ;
Abstract

A method and apparatus 10 for rapid optical phasing of optical devices utilizing white light interference fringe finding. The apparatus comprises a white light source 12, a beam splitter 18, a scanning mirror 20 and a stationary reflective surface 24. The scanning mirror 20 is moved in piston while reflected light is observed in an electro-optic sensor 32 at a receiver 28. A nulled pattern has been previously established at the receiver 28. An electrical signal from the electro-optic sensor is mounted at amplification and recording means 34 to identify variations in reflected light intensity that are caused by white light fringes. White light fringes only occur at zero optical difference, i.e. when the scanning mirror and stationary reflected surface are in phase.


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