The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 1989
Filed:
Jan. 21, 1988
Julius M Feinleib, Cambridge, MA (US);
Lawrence E Schmutz, Watertown, MA (US);
Abstract
A scalable, low light, high speed wavefront sensor system is disclosed for real time sensing of optical wavefronts using: a gateable image intensifier tube (GIIT), a monolithic lenslet array (MLM), a custom high speed switched silicon detector array, high speed analog/digital processing components, which are microprogrammed with signal processing algorithms. The incoming wavefront is reimaged by foreoptics, then divided into multiple subapertures by the use of the MLM. The MLM forms N.times.M target images which are intensified and transferred to a detector array in which the centroid of each target image on the pixels of the detector array define the local tilt aberration of the wavefront in each subaperture. This local tilt in each subaperture is calculated with microcoded implemented algorithms using real time processing electronics. By combining the local tilt in each subaperture with wavefront reconstruction techniques, the conjugate phase map of the original wavefront can be produced for adaptive optic applications. In order to sense a desired wavefront, the 'time of arrival' and flux of the incoming beam can be controlled by the processor via the time and duration of the signal to the GIIT.