The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 05, 1987

Filed:

Dec. 22, 1986
Applicant:
Inventor:

Louie J Lipp, Fallston, MD (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M / ;
U.S. Cl.
CPC ...
73663 ;
Abstract

This invention relates to a system for vibration testing of specimens using n electro-dynamic shaker. It overcomes the various undesirable consequences which attend the existing technology and methodology, which uses a constant thickness flat plate platen, by using an inverted, truncated pyramid type of platen, with both the base and top of square-rectangular-parallelpiped shapes, attached to a cylindrical shaker head. The outer portion of the platen has a very low mass and the section modulus is very high at the line of bending thereby increasing the resonant frequency of the platen while lowering the total weight of the platen, because there is less mass around the perimeter of the platen. The optimum shape of the pyramid is determined by a means which can be expedited by use of the computer program.


Find Patent Forward Citations

Lipp, Louie. (1987). Resonant free platen for vibration testing of test specimens (U.S. Patent No. H000338). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/H000338

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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