The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 19, 2018

Filed:

Feb. 24, 2015
Applicant:

The Procter & Gamble Company, Cincinnati, OH (US);

Inventors:

Stephen Michael Varga, Loveland, OH (US);

Walter Pieter Hendrik Laurentius Van der Klugt, Mechernich Satzvey, DE;

Rene Gaber, Euskirchen, DE;

Assignee:

The Procter & Gamble Company, Cincinnati, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61F 13/15 (2006.01); B32B 37/24 (2006.01); B05D 5/00 (2006.01); B32B 37/00 (2006.01); B32B 38/06 (2006.01); B32B 41/00 (2006.01);
U.S. Cl.
CPC ...
A61F 13/15772 (2013.01); A61F 13/15634 (2013.01); A61F 13/15658 (2013.01); A61F 13/15699 (2013.01); A61F 13/15723 (2013.01); A61F 13/15731 (2013.01); B05D 5/00 (2013.01); B32B 37/0076 (2013.01); B32B 37/24 (2013.01); B32B 38/06 (2013.01); B32B 41/00 (2013.01); A61F 2013/15821 (2013.01); B32B 2037/243 (2013.01); B32B 2307/726 (2013.01); B32B 2535/00 (2013.01);
Abstract

The present disclosure relates to methods and apparatuses for sensing distortions in patterns of reflected light to create profiles representing surface topographies of absorbent structures during the manufacture of absorbent articles. Inspection systems may include sensors arranged adjacent an advancing absorbent structure on a converting line. In turn, a controller may monitor and affect various operations on the converting line. The inspection systems herein may also include a radiation source that illuminates a surface of an absorbent structure with a predetermined pattern of light extending in the cross direction CD. The sensor senses distortions in patterns of light reflected from the illuminated surface of the absorbent structure and triangulates changes in elevation of the illuminated surface of the absorbent structure relative to the sensor. Based on the triangulated changes in elevation, the sensor creates a profile representing a surface topography of the illuminated surface of the absorbent structure.


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