The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 12, 2018

Filed:

Aug. 23, 2016
Applicant:

Futurewei Technologies, Inc., Plano, TX (US);

Inventors:

Hong Jiang, Kernersville, NC (US);

Zhihang Zhang, Cary, NC (US);

Jian Liang, Greensoboro, NC (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 17/21 (2015.01); H04B 17/14 (2015.01); H04B 17/00 (2015.01);
U.S. Cl.
CPC ...
H04B 17/21 (2015.01); H04B 17/00 (2013.01); H04B 17/0085 (2013.01); H04B 17/14 (2015.01);
Abstract

IP2 calibration efficiency can be improved by passing the calibration signal through the transceiver's duplexer instead of inserting the calibration signal directly onto transceivers receive circuit. Passing the calibration signal through the duplexer may reduce IP2 calibration periods for transceivers having less-permeable duplexers, or duplexers that provide better than average separation between the RX and TX circuits. IP2 calibration inefficiencies can also be reduced by using a binary-like search when computing the in-phase and quadrature-phase path correction coefficients of the IP2 correction code.


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