The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 12, 2018

Filed:

Jan. 21, 2013
Applicants:

Osram Sylvania Inc., Danvers, MA (US);

Bernhard Siessegger, Danvers, MA (US);

Marijan Kostrun, Newbury, MA (US);

Inventors:

Bernhard Siessegger, Danvers, MA (US);

Marijan Kostrun, Newbury, MA (US);

Assignee:

OSRAM SYLVANIA Inc., Wilmington, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/44 (2006.01); H02M 7/06 (2006.01); H05B 37/02 (2006.01); H05B 33/08 (2006.01); H01L 25/16 (2006.01); H05B 41/39 (2006.01); H01L 27/15 (2006.01); H01L 33/62 (2010.01); H01L 25/075 (2006.01); G01R 31/26 (2014.01); G01R 31/40 (2014.01); G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
H02M 7/06 (2013.01); H01L 25/167 (2013.01); H01L 27/156 (2013.01); H01L 33/62 (2013.01); H05B 33/0803 (2013.01); H05B 33/083 (2013.01); H05B 33/086 (2013.01); H05B 33/0806 (2013.01); H05B 33/0812 (2013.01); H05B 33/0815 (2013.01); H05B 33/0821 (2013.01); H05B 33/0827 (2013.01); H05B 33/0845 (2013.01); H05B 33/0848 (2013.01); H05B 33/0851 (2013.01); H05B 33/0884 (2013.01); H05B 33/0893 (2013.01); H05B 37/02 (2013.01); H05B 37/0209 (2013.01); H05B 41/39 (2013.01); G01R 31/028 (2013.01); G01R 31/2633 (2013.01); G01R 31/2635 (2013.01); G01R 31/40 (2013.01); G01R 31/44 (2013.01); H01L 25/0753 (2013.01); H01L 2224/48091 (2013.01); H01L 2224/48227 (2013.01); H01L 2224/48247 (2013.01); H01L 2924/12032 (2013.01); H01L 2924/12044 (2013.01); H01L 2924/1301 (2013.01); H01L 2924/1305 (2013.01); H01L 2924/13033 (2013.01); H01L 2924/13091 (2013.01); Y02B 20/343 (2013.01); Y02B 20/345 (2013.01); Y02B 20/346 (2013.01); Y02B 20/347 (2013.01); Y10T 307/615 (2015.04);
Abstract

Techniques are disclosed for assessing the conditions of LEDs and power supplies of solid state lighting systems. The techniques can be used, for example, to measure the capacitance of an output capacitor C in a switch-mode power supply (SMPS), and to measure the condition of the LEDs being driven by that power supply. In some cases, this assessment can be implemented in a lighting controller that controls the lighting system, which may be configured to simultaneously determine C and the conditions of LEDs. In one example case, the techniques can be implemented, for instance, in a micro-controller operating the lighting system. A lighting system implementing the techniques can be periodically assessed so as to provide real-time diagnostic capability. Numerous example embodiments of SMPS LED lighting systems will be apparent in light of this disclosure.


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