The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 12, 2018

Filed:

Apr. 14, 2015
Applicant:

Newport Fab, Llc, Newport Beach, CA (US);

Inventors:

George E. Parker, Irvine, CA (US);

Dieter Dornisch, Carlsbad, CA (US);

Lawrence L. Au, Laguna Hills, CA (US);

Assignee:

Newport Fab, LLC, Newport Beach, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/763 (2006.01); H01L 21/762 (2006.01); H01L 29/735 (2006.01);
U.S. Cl.
CPC ...
H01L 21/763 (2013.01); H01L 21/762 (2013.01); H01L 21/76224 (2013.01); H01L 29/735 (2013.01);
Abstract

A semiconductor structure having a deep trench isolation structure for improved product yield is disclosed. The semiconductor structure includes a deep trench having a filler material therein. The deep trench is adjacent to field oxide regions in a semiconductor substrate. A high density plasma (HDP) oxide layer, substantially free of thermal oxide, is situated over the filler material in the deep trench. The HDP oxide layer has a substantially co-planar top surface with at least one of the field oxide regions. According to the present disclosure, formation of nodules in the deep trench is prevented.


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