The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2018
Filed:
Oct. 13, 2015
Omron Corporation, Kyoto-shi, Kyoto, JP;
Tetsuya Fukumoto, Kusatsu, JP;
Toshiyuki Higuchi, Kusatsu, JP;
Kohei Murakami, Kusatsu, JP;
Keishi Yayama, Kusatsu, JP;
Satoshi Fujii, Kusatsu, JP;
OMRON Corporation, Kyoto-shi, JP;
Abstract
The reliability of testing a normally closed contact in a relay unit may involve the following. While the load is de-energized, sending a test signal to a normally closed contact (b, b) and detecting the state of the returning test signal sent. Resending a test signal when a detection result does not satisfy a predetermined criteria, and re-detecting the state of the returning test signal resent. The state of the returning test signal resent may be assessed as normal when the re-detection result satisfies the predetermined criteria.