The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2018
Filed:
Mar. 27, 2015
Applicant:
Honeywell International Inc., Morristown, NJ (US);
Inventor:
Robert Rabe, Chanhassen, MN (US);
Assignee:
Honeywell International Inc., Morris Plains, NJ (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 7/02 (2006.01); G11C 7/22 (2006.01); G11C 27/02 (2006.01); H03K 3/013 (2006.01); H03K 3/356 (2006.01); H03K 3/3562 (2006.01); H03K 19/003 (2006.01);
U.S. Cl.
CPC ...
G11C 7/02 (2013.01); G11C 7/222 (2013.01); G11C 27/02 (2013.01); H03K 3/013 (2013.01); H03K 3/35625 (2013.01); H03K 3/356121 (2013.01); H03K 19/00338 (2013.01);
Abstract
A circuit comprises a data storage element that includes a sampling stage configured to sample a data value, the sampling stage comprising a plurality of p-type devices, wherein at least one of the plurality of p-type devices is non-collinear relative to the other p-type devices, a plurality of n-type devices, wherein at least one of the plurality of n-type devices is non-collinear relative to the other n-type devices, a feedback stage configured to maintain the data value sampled by the sampling stage.