The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 12, 2018

Filed:

Mar. 14, 2016
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Albrecht Johannes Lindner, La Jolla, CA (US);

Kalin Atanassov, San Diego, CA (US);

Stephen Verrall, Carlsbad, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2017.01); G06T 5/00 (2006.01); G06K 9/03 (2006.01); G06K 9/38 (2006.01); G06T 7/50 (2017.01); G06T 5/40 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0057 (2013.01); G06K 9/03 (2013.01); G06K 9/38 (2013.01); G06T 5/001 (2013.01); G06T 5/008 (2013.01); G06T 5/009 (2013.01); G06T 5/40 (2013.01); G06T 7/50 (2017.01); G06T 2207/10028 (2013.01); G06T 2207/20004 (2013.01); G06T 2207/20182 (2013.01);
Abstract

Systems and methods for correcting errors in a depth map generated by a structured light system are disclosed. In one aspect, a method includes dividing a depth map into segments and calculating a density distribution of the depth values for each segment. The method includes detecting error (or 'outlier') values by determining the depth values that fall outside of a range of depth values, the range of depth values representative of the highest density depth values for a given segment. The method includes detecting error values in the depth map as a whole based on the density distribution values for each segment.


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