The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2018
Filed:
Sep. 06, 2016
Altek Semiconductor Corp., Hsinchu, TW;
Yu-Chih Wang, Hsinchu, TW;
Shou-Te Wei, Hsinchu, TW;
Yu-Wei Huang, Hsinchu, TW;
Fu-Kui Yang, Hsinchu, TW;
Chi-Ying Huang, Hsinchu, TW;
Altek Semiconductor Corp., Hsinchu, TW;
Abstract
The disclosure provides a method and a system for multi-lens module alignment, adapted to perform alignment on a multi-lens module having at least a first lens and a second lens during its manufacturing stage, where the method includes the following steps. A calibration object is first captured by using the first lens and the second lens to accordingly generate intrinsic parameters and external parameters of the first lens and the second lens, where the external parameters of the first lens and the second lens are associated with a common reference coordinate system. A target object is next captured by using the first lens and the second lens, and captured images of the target object are processed by using the intrinsic parameters and the external parameters to generate rectified images. The first lens and the second lens are adjusted and aligned according to the rectified images.