The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2018
Filed:
Mar. 16, 2016
Planet Labs, Inc., San Francisco, CA (US);
Louis Hu Rousmaniere, San Francisco, CA (US);
Kenneth James Kryda, Sunnyvale, CA (US);
Planet Labs, Inc., San Francisco, CA (US);
Abstract
Systems and methods are provided for enhancing object feature visibility for overhead imaging. In one embodiment, a computing system can obtain information associated with one or more locations of an imaging platform and one or more locations of a solar source. The system can determine one or more positional ranges of the imaging platform relative to the solar source based, at least in part, on such information. The positional ranges can be indicative of positions at which the imaging platform is to obtain image frames depicting at least a portion of a target object. The system can send, to the imaging platform, a set of data indicative of the positional ranges and can receive, from the imaging platform, a set of data indicative of the image frames depicting at least a portion of the target object. The image frames being captured based, at least in part, on the positional ranges.