The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 12, 2018

Filed:

Dec. 30, 2015
Applicant:

Emc Corporation, Hopkinton, MA (US);

Inventors:

Patricia Gomes Soares Florissi, Briarcliff Manor, NY (US);

Michal Ziv Ukelson, Lehavim, IL;

Ran Dach, Kiryat Yam, IL;

Arnon Benshahar, Tel Aviv, IL;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01); G01N 33/50 (2006.01); G06F 19/22 (2011.01); G06F 19/26 (2011.01); G06F 19/24 (2011.01);
U.S. Cl.
CPC ...
G06F 19/22 (2013.01); G06F 19/24 (2013.01); G06F 19/26 (2013.01);
Abstract

A method comprises obtaining results of metagenomics sequencing performed on biological samples from respective sample sources, identifying particular ones of the biological samples that are related to a disease, infection or contamination based at least in part on the results of metagenomics sequencing, generating a genomic comparison component comprising hit abundance score vectors for respective ones of the identified samples, generating an epidemiologic comparison component comprising a graph in which nodes corresponding to patients are connected in the graph based at least in part on patient comparative indexes, collectively processing portions of the genomic comparison component with portions of the epidemiologic comparison component to further characterize the disease, infection or contamination, and updating a profile of the disease, infection or contamination based at least in part on the further characterization.


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