The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 12, 2018

Filed:

Jun. 03, 2016
Applicant:

Sandisk Technologies Llc, Plano, TX (US);

Inventors:

Anand Sharma, Bangalore, IN;

Shiv Harit Mathur, Bangalore, IN;

Rajeswara Rao Bandaru, Bangalore, IN;

Assignee:

SanDisk Technologies LLC, Plano, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/455 (2018.01); G06F 17/50 (2006.01); H01L 27/02 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5081 (2013.01); G06F 17/5072 (2013.01); H01L 27/0248 (2013.01); G06F 2217/70 (2013.01);
Abstract

A design flow of an integrated circuit may include a skeleton input/output (I/O) generation stage during which information about ESD protection circuitry and rails but not functional circuitry of the I/O cells of the integrated circuit is generated. The information may be used in an ESD analysis stage to generate performance characteristics of the ESD protection circuitry. Results of the ESD analysis may then be used to design optimized ESD protection circuitry along with the rest of the circuit components of the I/O cells. In this way, the design of ESD protection circuitry may be optimized without having to redo a completed I/O cell design and significantly delay the design flow before tapeout.


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