The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2018
Filed:
Mar. 30, 2016
Applicant:
Emc Corporation, Hopkinton, MA (US);
Inventors:
Prashant Kulli, Bangalore, IN;
Praveen Satya, Bangalore, IN;
Assignee:
EMC IP Holding Company LLC, Hopkinton, MA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/20 (2006.01); G06F 11/07 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/2094 (2013.01); G06F 11/0793 (2013.01); G06F 11/3485 (2013.01); G06F 2201/805 (2013.01);
Abstract
A method, system, and computer program product for managing performance of an application I/O comprising determining paths from a first host to a node in a cluster that are flaky; and initiating a failover mechanism for the application I/O from the node in the cluster to a second node in the cluster ensuring seamless execution of the application I/O in the cluster.
Kulli, Prashant. (2018). Failover in a san environment (U.S. Patent No. 9996437). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9996437
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile