The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 12, 2018
Filed:
Mar. 24, 2016
Boe Technology Group Co., Ltd., Beijing, CN;
Hefei Boe Optoelectronics Technology Co., Ltd., Heifei, Anhui, CN;
Yan Jiang, Beijing, CN;
Xianzhen Tang, Beijing, CN;
Xiaoming Lu, Beijing, CN;
Dan Li, Beijing, CN;
Xiaowei Gong, Beijing, CN;
Chiyoung Kim, Beijing, CN;
BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;
HEFEI BOE OPTOELECTRONICS TECHNOLOGY CO., LTD., Hefei, Anhui, CN;
Abstract
The invention discloses a high temperature and high humidity testing device and a high temperature and high humidity testing system. The high temperature and high humidity testing device comprises: a test platform composed of a work area and a non-work area, the work area is used for carrying a under-test portion of a display panel, and the non-work area is used for carrying a non-test portion of the display panel; and a sealing cover arranged above the work area, wherein the sealing cover and the test platform jointly form a sealed chamber in the work area, the test platform is provided with a gas guide through groove in the work area, and the gas guide through groove is used for delivering high temperature and high humidity gas to the sealed chamber.